Byk-gardner Gmbh

Peter Schwarz

Uwe Sperling

Konrad Lex

Severin Wimmer

Gerhard Hentschel

Ralf Zellner

The invention relates to a docking stationfor a surface measuring apparatus, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surfacewhich can be brought into a covered state in which it is covered from the environment of the docking stationand an uncovered state in which it is not covered from the environment of the docking station. When the surface measuring apparatusis in the docking stationand the reference measuring surfaceis in the uncovered state, the surface measuring apparatuscan perform a reference measurement of the reference measuring surfaceand can calibrate the surface measuring apparatususing the reference measurement. In contrast, when the reference measuring surfaceis in the covered state, it is not exposed to the environment of the docking stationand is therefore protected from, for example, dust, light, moisture or mechanical impacts. The covered and uncovered states of the reference measuring surfaceare preferably reached through a movement of the reference measuring surfaceitself or through a movement of a cover for the reference measuring surface

Docking station for a surface measuring apparatus

The invention relates to an apparatus for the investigation of surface properties with a housing, a light source which directs light through an opening in the housing onto a surface to be investigated, with a first detector device which is arranged inside at a first pre-set angle with respect to the light beam radiated onto the surface by the light source, with a second detector device which is arranged at a second pre-set angle with respect to the light beam radiated onto the surface by the light source and with a third detector device which is arranged inside the housing at a third pre-set angle with respect to the light beam radiated onto the surface by the light source. According to the invention the apparatus has at least two filter elements with optical properties which are different from each other which are arranged on a common carrier movable with respect to the light source, in such a way that each of these filter elements is optionally capable of being brought into a beam path between the light source and the surface.

Apparatus and method of investigating surface properties

Radiation is irradiated by an irradiation device at a pre-set angle of incidence with respect to the surface onto the surface to be investigated, and the radiation scattered and/or reflected by this surface arrives at a radiation detector device arranged at a pre-set detection angle with respect to the surface and having an image-recording unit which records black-and-white images, wherein this radiation detector device permits a spatially resolved detection of the radiation reaching it. The irradiation device directs radiation in a first wavelength range onto the surface and the image-recording unit records a first spatially resolved image of this radiation scattered and/or reflected from the surface and the irradiation device directs radiation in a second wavelength range onto the surface and the image-recording unit records a second spatially resolved image of this radiation scattered and/or reflected from the surface.

Apparatus and method of investigating coatings with effect pigments

A method is provided for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analyzed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analyzed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analyzing the image. In addition to the result value, a further value (B) characteristic of the surface is determined and this characteristic value is displayed together with the result value (I).

Method and apparatus for determination of surface properties of coatings by determining contrast of an evaluated image

A method of determining optical properties of textured surfaces by irradiation of the surface to be investigated. At least part of the radiation irradiated onto the surface and reflected by the latter is detected by a detector device which permits a location-resolved evaluation of the radiation striking it. A first characteristic value from the radiation detected, characteristic of a texture of the surface is detected. A second characteristic value from the radiation detected, characteristic of a further optical property of the surface is detected. And, a result value is determined on the basis of the first characteristic value and the second characteristic value.

Method and device for determining properties of textured surfaces

An apparatus for measuring optical properties of transparent materials with a first illumination device which illuminates the material to be investigated along a pre-set illumination path with a pre-set radiation, with a radiation recording space which records radiation passed on by the material to be investigated. The radiation recording space is arranged so that radiation emitted by the first illumination device first strikes the material and then at least for a time an inner wall of the radiation recording space. A radiation detector device is arranged to record radiation reflected and/or scattered essentially only from the inner wall. A second illumination device suitable for emitting modulated radiation also illuminates the inner wall.

Apparatus and method for measuring optical properties of transparent materials

A method for optical investigation of textured surfaces involves the steps of irradiation of radiation onto the surface to be investigated; reception of an image from at least part of the radiation irradiated onto the surface and reflected by the surface; location-resolved evaluation of the image recorded and determination of at least one value K which is characteristic of this image. A parameter G which is characteristic of the surface is determined while using the characteristic value K and while using at least one further property E known beforehand or determined of the surface.

Device for the investigation of textured surfaces

A colour measuring unit () comprising a radiation device () which emits light onto a surface () to be examined, wherein the radiation device () comprises at least one semiconductor-based light source (), and a radiation detector device () which receives at least a portion of the light scattered by the surface and outputs a signal characteristic of this light, wherein the radiation detector device () allows a spectral analysis of the light impinging thereon. According to the invention, the colour measuring unit comprises at least one sensor device () which determines at least one electrical parameter of the light source (), and also a processor device () which outputs from this measured parameter at least one value characteristic of the light emitted by the radiation device ().

Colour measuring unit

The invention relates to a portable device () for the determination of surface properties with a measurement apparatus () which directly determines locally the topography of a surface () under investigation and issues at least one measured value that is characteristic of this local topography, and with a processor apparatus which, taking account of a multiplicity of initial measured values, issues at least one result value characteristic of the global topography of the surface.

Device and method for the topographical determination of surface properties

An apparatus for determining surface properties, comprises at least a first radiation device which emits radiation onto a surface to be analyzed, at least a first radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by the surface and outputs at least a first measurement signal which is characteristic of the reflected or scattered radiation, and at least a further radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by a surface and outputs at least a second measurement signal which is characteristic of the reflected or scattered radiation.

Determining surface properties with angle offset correction

An apparatus () for analysing surface properties, comprising a first radiation device () which emits radiation directly onto a surface () to be analyzed, a first illumination device () for indirectly illuminating the surface () to be analyzed, a first radiation detector device () which receives at least part of the radiation thrown back from the surface () to be analyzed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device () is provided which is at least partially illuminated by the first illumination device () and which transmits scattered radiation onto the surface () to be analyzed.

Apparatus for analysing surface properties with indirect illumination

A device for examining the optical properties of surfaces includes at least one first radiation device emitting radiation to a surface to be examined at least at a first predetermined spatial angle, at least one first detector for capturing the radiation emitted to and reflected back from the surface, wherein the detector, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface. At least one spatial angle at which the radiation device and/or the detector are positioned, is variable and the radiation device and the detector are positioned in a space at least part of which exhibits light-reflecting properties.

Device for a goniometric examination of optical properties of surfaces

Disclosed is an apparatus for determining surface properties, comprising at least a first radiation device which emits radiation onto a surface to be analysed, at least a first radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by the surface and outputs at least a first measurement signal which is characteristic of the reflected or scattered radiation, and at least a second radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by a surface and outputs at least a second measurement signal which is characteristic of the reflected or scattered radiation. According to the disclosure, the first radiation detector device is offset by a first predefined angle &#x3b2;with respect to the direction of the radiation reflected by the surface, and the further radiation detector device is offset by further predefined angle &#x3b3;with respect to the direction of the radiation reflected by the surface, and the ratio between the value of the further predefined angle &#x3b3;and the value of the first predefined angle &#x3b2;is at least 1.5:1.

Apparatus and method for determining surface properties

A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to and reflected back from the surface wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface, and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Device for examining the optical properties of surfaces

The present invention describes a method for an apparatus for examining surface properties. Properties of effect pigments are to be examined in particular. A surface () to be examined is examined at different emission and reception angles and any curvature of the effect pigments is deduced on the basis of these different angles.

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Königsdorf, Germany

Peter Schwarz