Agilent Technologies, Inc.

Peter Schinzel

Michael Fleischer-Reumann

Guenther Tietz

A method for testing a digital circuit as a Device under Test&#x2014;DUT, including determining a Bit Error Rate&#x2014;BER&#x2014;value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of executing the test for each one of the number of sample points for providing a statement about the condition of the DUT.

Bit error rate measurement

Disclosed is a timing generator including a frequency generator for generating an output signal, and circuitry for providing a nominal parameter setting value to the frequency generator for setting a nominal value of a parameter of the output signal, such as frequency, delay time and/or pulse width. The timing generator further includes a memory for storing predefined parameter setting values, whereby the memory is directly coupled to the frequency generator for directly applying parameter setting values stored in the memory to the frequency generator for modifying the nominal value of the parameter.

System for generating timing signal varying over time from an ideal signal by combining nominal parameter value signal and parameter variation value signal

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Gaertringen, Germany

Peter Schinzel