Carl Zeiss Microscopy Gmbh

Peter Schacht

Daniel Stegmann

Thomas Milde

Saskia Pergande

Daniel Harangozo

Thomas Kalkbrenner

Daniel Schwedt

Tiemo Anhut

Jörg Siebenmorgen

Ingo Fahlbusch

Nils Langholz

Hubert Wahl

Nico Presser

Nils Egewardt

Andreas Möbius

Tobias Hackel

Anna Maria Büchner

An illumination unit for microscopes has an MID structure for the free spatial arrangement of different electronic and optical components, so that surfaces of a three-dimensional carrier are available as a replacement for printed circuit boards. The MID structure designed as an illumination unit contains a closed annular main part having an annular free beam opening, where columns are arranged on the main part. On the free ends of the columns, illumination means are provided which can be contacted via conductor paths provided on the surface of the MID structure. The columns contain a cooling structure on a side surface facing away from the free beam opening, and a plug for the power supply and a control unit for controlling the illumination means are provided on the main part of the MID structure. The MID structure designed as an illumination unit is provided in a housing of a microscope objective.

Illumination unit for microscopes

Detecting emission light, in a laser scanning microscope, wherein the emission light emanating from a sample is guided onto a two-dimensional matrix sensor having a plurality of pixels and being located on an image plane, and a detection point distribution function is detected by the matrix sensor in a spatially oversam pled manner. The emission light emanating from the sample is spectrally separated in a dispersion device; the spectrally separated emission light is detected by the matrix sensor in a spectrally resolved manner; and during the analysis of the intensities measured by the pixels of a pixel region, the spectral separation is cancelled at least for some of said pixels. Additional aspects relate to a detection device for the spectrally resolved detection of emission light in a laser scanning microscope and to a laser scanning microscope.

Method for detecting emission light, detection device and laser scanning microscope

The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens, in particular on a displacement path of an optical zoom lens of a microscope. The optical zoom lens is arranged in a beam path between an object to be recorded and an electronic image sensor. In a first method step, an optical marker is introduced into the beam path at a position of the beam path located between the object to be recorded and the optical zoom lens, such that the optical marker passes the optical zoom lens and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens. The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor and to an electronic image recording device.

Method for determining a deviation on a displacement path of an optical zoom lens and method for correction and image recording device

An optical lens for use in a media feed device, having a first lens surface and a second lens surface, wherein the first lens is provided to be facing an object to be observed and the second lens surface is provided to be facing away from the object to be observed. At least one channel opening onto the first lens surface is present, wherein the at least one channel runs through the optical lens and at least one section of a media line is formed in the at least one, channel or, if a plurality of channels are formed, at least one of the plurality of channels opens up outside a highest point in alignment with a line that is vertical with respect to the first lens surface and to the surface of the earth.

Optical lens for use in a media supply device and lens, media supply device and microscope

The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens (), in particular on a displacement path of an optical zoom lens () of a microscope. The optical zoom lens () is arranged in a beam path () between an object () to be recorded and an electronic image sensor (). In a first method step, an optical marker is introduced into the beam path () at a position of the beam path () located between the object () to be recorded and the optical zoom lens (), such that the optical marker passes the optical zoom lens () and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens (). The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor () and to an electronic image recording device.

An objective-changer apparatus for a microscope system comprising an objective-transfer element with at least one objective holder for holding an objective that has been provided with an adapter, wherein the objective-transfer element moves a selected active objective into position in a transfer position in controlled fashion and an objective axis of the active objective does not coincide with the optical axis of the microscope system in the transfer position. A receiving apparatus is adjustable in the direction of the optical axis of the microscope system and can be brought into contact with the adapter. The receiving apparatus transports the active objective along a transport path in a transport direction orthogonal to the microscope system's optical axis between the transfer position and a work position in line with the microscope system's optical axis. The transport path is shorter than the extent of the objective holder in the transport direction.

Objective changer apparatus for a microscope system, adapter for an objective and method for moving an objective into position

The invention relates to a microscope () having an objective interchange apparatus () comprising a holder () for receiving a number of objectives () at respective holder positions () and an objective receptacle () which is configured for receiving an objective () and is arranged in an optical beam path () of the microscope (). The microscope () is characterized by an objective delivery device () which is configured for transporting in each case a selected objective () having an objective retainer () between its holder position (), which is delivered to a transfer position (&#xdc;P), and the objective receptacle (), wherein the objective receptacle () remains in the optical beam path () during the transport of the objective (). The objective retainer () has an outer centering diameter () as a reference surface, which diameter is guided against a lateral reference surface located in the objective receptacle () such that a reproducible positioning perpendicular to an optical axis () of the microscope () may be achieved.

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Erfurt, Germany

Peter Schacht