Siemens Aktiengesellschaft

Peter Rummel

Christian Hoffmann

Eckhard Wolfgang

Frank Forster

Paul Koellensperger

Anna Reischl

Karl Hohberger

Wilhelm Beutel

Hans Grasmueller

In order to determine three-dimensional coordinates of a surface () of an object () to be detected, the changes in color of a color pattern (), which is projected by a projector () onto the surface (), are to be encoded by using a redundant code. An analyzing method, which analyzes the changes in color occurring in an image () recorded by a camera (), is insensitive to changes on the surface (). In addition, the contour of the object () can be determined with a single recording. The method is thereby also suited for moving objects.

Method and device for three-dimensionally detecting objects and the use of this device and method

A coarse or rough segmentation apparatus has been developed for use in a sensor system for analyzing half-tone images. In contrast with previously employed methods, the apparatus is based on the pipeline principle. In the image picked up by the camera, edges of an object are represented in the form of a sequence of points of high contrast as compared with the surroundings. These edges are initially sought out and tracked by so-called edge tracking. Subsequently, in a rough or coarse segmentation, this line is divided into as large as possible contiguous pieces or sections of equal curvature and pieces or sections with a strong directional change.

Arrangement for the segmentation of lines

A particle probe is positioned to a specific region when an actual position of the specific region appears shifted relative to its rated position due to local fields, and can therefore not be defined with high precision. The particle probe is positioned to a prescribed region. The particle probe is then deflected in the environment of this region such that the particle probe impinges different regions at the prescribed region. The position of the specific region is determined from the measured signals which are triggered given incidence of the particle probe on the different regions. The particle probe is then positioned to the specific region. An electrical line may form a test spot at the specific region wherein one dimension thereof is greater than a width thereof.

Method and apparatus for automatically positioning a particle beam

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Munich, Georgia

Peter Rummel