Seagate Technology Incorporated

Peter R Goglia

Yufeng Li

Zine-Eddine Boutaghou

Christopher C Zahn

Shanlin X Hao

Moshe Olim

Jeffery K Berkowitz

Stefan A Weissner

Sarah R Marotz

Ling Ma

Clarence Matson

James Wagner

The present invention is a method of using direct head electrical response signals for feedback process control. When lapping the air bearing surface of a bar of sliders, a magnetic field is applied to the air bearing surface and a bias current is applied to the reader elements. A head electrical response, such as amplitude or resistance change, is measured and is used to control the lapping device. Using a fixture which allows individual slider machining, a controller can be used to monitor the head response signal for each slider on the bar and individually control each slider on the bar so that material removal over each slider proceeds until a predetermined target stripe height is reached.

Head performance based nano-machining process control for stripe forming of advanced sliders

A method and apparatus are provided characterizing the shape of a surface such as a bearing surface on a slider and for processing the shape. The shape is characterized by fitting a curve having a desired shape to measurement data and then determining residual deviations from the desired shape within localized regions. The surface is processed by selecting a material stress pattern to be applied to a working surface of the slider based on measured and desired contour shape parameters in a plurality of localized areas on the bearing surface. The measured contour shape parameter within a first of the plurality of localized areas is weighted more heavily than those within the other localized areas.

Method of controlling localized shape of a data head and for characterizing the shape

A slider assembly for selectively altering a position of a transducing head with respect to a rotatable disc includes a slider body having opposing leading and trailing edge surfaces, opposing top and bottom surfaces, and opposing first and second side surfaces. The slider body is arranged to be supported by a support structure over a surface of the rotatable disc. A slot is formed in the slider body proximate the trailing edge surface, forming a hinge joining a distal portion of the slider body adjacent the trailing edge surface to a main portion of the slider body. The transducing head is carried by the distal portion of the slider body. A microactuator is attached to the slider body adjacent to the hinge. The microactuator is responsive to electrical control signals to selectively bend the hinge to alter the position of the transducing head with respect to the main portion of the slider body.

Piezoelectric engageable slider and slider microactuator

The present invention provides a calibration standard for the uniform calibration of flying height testers. The calibration standard comprises a head assembly held in contact with a transparent disc through the use of a load spring. The transparent disc has a plurality of grooves formed in a surface facing the head assembly. A cover case is attached to the glass disc at one end and provides a sealed environment for the interface between the head assembly and the transparent disc.

Calibration standard for flying height tester having a head mounted on a

A calibration standard for uniformly calibrating flying height testers. The calibration standard includes a wedge slider held in contact with a glass disc by a load bridge, load spring and cover case. The wedge slider has a first rail and a second rail extending along its length and has a raised end to form an optical wedge between the glass disc and the first and second rails. A profilometer is used to map any surface irregularities on the surfaces of the first and second rails facing the disc, allowing the calculation of an accurate expected distance, or flying height, between the surfaces and the disc at each horizontal location along the length of the wedge slider. The expected flying height is compared to a flying height measured through optical interference techniques to calibrate the flying height tester.

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Edina, MN, United States of America

Peter R Goglia