Koninklijke Philips Corporation N.v.

U.S. Philips Corporation

Peter Lex Alving

Herfried Karl Wieczorek

Herman Stegehuis

Albert Louw Faber

Heidrun Steinhauser

Johannes Wilhelmus Maria Jacobs

Hendrik Jan Meulenbrugge

Johannes Albert Luijendijk

Johannes J Stouten

Andreas Goedicke

Onno Jan Wimmers

Christiaan Kok

Alessandro Guido Radaelli

Jorrit Jorritsma

Johannes Henricus Maria Joosten

Roger Steadman Booker

The invention relates to a combined imaging detector for detection of gamma and x-ray quanta comprising an x-ray detector () for generating x-ray detection signals in response to detected x-ray quanta and a gamma detector () for generating gamma detection signals in response to detected gamma quanta. The x-ray detector () and the gamma detector () are arranged in a stacked configuration along a radiation-receiving direction (). The gamma detector () comprises a gamma collimator plate () comprising a plurality of pinholes (), and a gamma conversion layer () for converting detected gamma quanta into gamma detection signals.

Combined imaging detector for x-ray and nuclear imaging

The present invention relates to an apparatus for imaging an object. It is described to receive () by at least a portion of first pixels of a first area (A, A, A, A, A, A, A, A, A) of an X-ray detector () first radiation emitted by at least one X-ray source (). The X-ray detector is configured such that X-ray radiation received by a pixel leads to the generation of signal in that pixel. A plurality of first signals representative of corresponding signals on the plurality of first pixels are stored () in at least one first plurality of storage nodes associated with the first area. Second radiation emitted by the at least one X-ray source () is received () by at least a portion of second pixels of a second area (B, B, B, B, B, B, B, B, B; C) of the X-ray detector. A plurality of second signals representative of corresponding signals on the plurality of second pixels are stored () in at least one second plurality of storage nodes associated with the second area.

Driving of an X-ray detector to compensate for cross scatter in an X-ray imaging apparatus

The invention relates to a combined imaging detector () for the detection of x-ray and gamma quanta. The combined imaging detector () is adapted for simultaneous detection of gamma and x-ray quanta. The combined imaging detector () includes an x-ray anti-scatter grid (), a layer of x-ray scintillator elements (), a first photodetector array (), a layer of gamma scintillator elements (), and a second photodetector array () that are arranged in a stacked configuration along a radiation-receiving direction (). The x-ray anti-scatter grid () comprises a plurality of septa () that define a plurality of apertures () which are configured to collimate both x-ray quanta and gamma quanta received from the radiation receiving direction () such that received gamma quanta are collimated only by the x-ray anti-scatter grid (). The use of the x-ray anti-scatter grid as a collimator for received gamma quanta results in a significantly lighter combined imaging detector.

Combined X-ray and nuclear imaging

A radiation detector for combined detection of low-energy radiation quanta and high-energy radiation quanta has a multi-layered structure. A rear scintillator layer () is configured to emit a burst of scintillation photons responsive to a high-energy radiation quantum being absorbed by the rear scintillator layer (). A rear photosensor layer () attached to a back side of the rear scintillator layer () is configured to detect scintillation photons generated in the rear scintillator layer (). A front scintillator layer () arranged in front of the rear scintillator layer () opposite the rear photosensor layer () is configured to emit a burst of scintillation photons responsive to a low-energy radiation quantumbeing absorbed by the front scintillator layer (). A front photosensor layer () attached to a front side of the front scintillator layer () opposite the rear scintillator layer () is configured to detect scintillation photons generated in the front scintillator layer (). The high-energy radiation quantum is a gamma ray and the low-energy radiation quantum is an X-ray.

Radiation detector for combined detection of low-energy radiation quanta and high-energy radiation quanta

An X-ray examination apparatus includes an X-ray source, an X-ray detector and an exposure control system. The exposure control system is arranged to control the X-ray source so as to perform a test exposure at a low X-ray dose and to perform an X-ray exposure at a higher X-ray dose. The X-ray detector applies a control signal resulting from the test exposure to the exposure control system and the X-ray source is adjusted on the basis of this control signal. The X-ray exposure produces an X-ray image and the X-ray detector supplies an image signal representing this X-ray image. The exposure control system is arranged to adjust the X-ray detector to a low spatial resolution during the test exposure and to a high spatial resolution during the X-ray exposure. The X-ray detector preferably includes a sensor matrix having sensor elements arranged in columns and rows. The spatial resolution is adjusted by deriving the control signal and the image signal from large and small groups of sensor elements, respectively.

X-ray examination apparatus with exposure control

An X-ray examination apparatus utilizes an image sensor matrix for picking up an X-ray image, i.e. for converting incident X-rays into electric charges. The X-ray examination apparatus includes a control circuit for controlling the image sensor matrix so as to form a dark signal. The X-ray examination apparatus also includes a correction unit which is arranged to derive the electronic image signal from the primary image and the dark signal. The electronic image signal represents image information in the X-ray image and has not been disturbed by electric charges which have been read with a delay.

X-ray examination apparatus including an image sensor matrix with a correction unit

X-ray examination apparatus including an image sensor matrix with a

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Eindhoven, Netherlands

Peter Lex Alving