Seagate Technology Incorporated

Peter John Gunderson

Huiwen Liu

Lin Zhou

Dale E Egbert

John L Ibele

Joel William Hoehn

Timothy William Stoebe

David James Ellison

Zubair Ahmed Khan

Lijuan Zhong

Kevin Lamber Mayer

Jonathan Arland Nelson

Glenn Johnson

Gary M Singer

Ruhai Tian

Vince B Engelkes

Kah Choong Loo

Cing Siong Ling

The present disclosure relates to separating parts (e.g., sliders and/or row bars) from an adhesive and carrier during the manufacture of parts to be used in a data storage device such as a hard disc drive.

Methods of separating one or more substrates that are adhesively bonded to a carrier, and related systems and apparatuses

A plurality of transducer bars may be concurrently translated from a first orientation to a second orientation by a translation system that has first and second plates. The first plate can have a plurality of first notches with each first notch shaped to hold a transducer bar in a horizontal orientation. The second plate can have a plurality of second notches with each second notch shaped to translate the transducer bar from the horizontal orientation to a vertical orientation.

Transducer bar translation system and method of translating a transducer bar

A tray system for containing multiple electronic components that includes a first tray having a planar member and a plurality of pockets recessed into an upper surface of the planar member, wherein each of the pockets includes: a bottom surface; an aperture extending through the bottom surface; a supply channel extending from a lower surface of the planar member to the aperture; a plurality of wall segments extending from the bottom surface of the pocket to the upper surface of the planar member and defining a perimeter of the pocket; and a plurality of pedestals extending from the bottom surface of the pocket toward the upper surface of the first tray.

High flow packaging for slider cleaning

Disclosed herein are embodiments of a method of making a lubricant composition for lapping a ceramic material. The method includes mixing a base lubricant component and a powdered wax composition component to form the lubricant composition. The powdered wax composition component includes a powdered wax dispersion or a powdered wax emulsion. The amount of powdered wax composition component mixed with the base lubricant component is from 0.01 to 10 percent by weight of the lubricant composition. Also disclosed herein are embodiments of related lubricant compositions and/or methods of using the lubricant to lap a ceramic substrate (e.g., one or more bars of sliders).

Lubricant composition for lapping ceramic material, and related methods

The disclosure is related systems and method for improved accuracy and precision in Raman spectroscopy. In one embodiment, a device may comprise a Raman spectroscopic apparatus configured to determine a property of a sample by directing photons at the sample and measuring a resulting Raman scattering, a positioning apparatus capable of manipulating a position of the sample, and the device being configured to selectively adjust a focus of the Raman spectroscopic apparatus to adjust an intensity of the Raman scattering. Another embodiment may be a method comprising performing a depth focus Raman spectra screening on a sample to determine a depth focus with a maximum-intensity Raman spectra, wherein the depth focus spectra screening comprises performing Raman spectra scans on the sample at a plurality of depth foci, and modifying a process based on a result of the Raman spectra scan at the depth focus with the maximum-intensity Raman spectra.

Accuracy and precision in raman spectroscopy

Methods for forming a slider for a disc drive. One method includes forming a plurality of sliders on a wafer, applying a self-assembled monolayer coating on the plurality of sliders, and cutting the plurality of sliders into a plurality of individual sliders. Another method includes forming a plurality of sliders on a wafer, applying a low surface energy coating on the plurality of sliders, and cutting the plurality of sliders into a plurality of individual sliders.

Process to inhibit slider contamination during processing

A semi-automated method for atomic force microscopy ('AFM') scanning of a sample is disclosed. The method can include manually teaching a sample and AFM tip relative location on an AFM tool; then scanning, via a predefined program, on the same sample or other sample with same pattern to produce more images automatically.

Semi-auto scanning probe microscopy scanning

In certain embodiments, a probe scans a surface to produce a first scan. The first scan is used to estimate a vertical offset for scanning the surface to produce a second scan. In certain embodiments, an AFM device engages a probe to a surface using a piezo voltage. The probe scans the surface to produce a first scan. The first scan is used to estimate a vertical offset such that the probe uses the piezo voltage to engage the surface for a second scan at a different vertical position.

Methods and devices for correcting errors in atomic force microscopy

A method and associated apparatus for topographically characterizing a workpiece. The workpiece is scanned with a scanning probe along a first directional grid, thereby scanning a reference surface and an area of interest subportion of the reference surface, at a variable pixel density including a first pixel density outside the area of interest and a second pixel density inside the area of interest to derive a first digital file characterizing topography of the workpiece. The workpiece is further scanned along the reference surface and the area of interest with the scanning probe along a second directional grid that is substantially orthogonal to the first directional grid and at a constant pixel density to derive a second digital file characterizing topography of the workpiece. A processor executes computer-readable instructions stored in memory that generate a topographical profile of the workpiece in relation to the first and second digital files.

Variable pixel density imaging

An apparatus and associated method for topographically characterizing a workpiece. A scanning probe obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file and to scan a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest.

Scanning probe microscopy employing correlation pattern recognition

An atomic force microscopy (AFM) method includes a scanning probe that scans a surface of a structure to produce a first structure image. The structure is then rotated by 90&#xb0; with respect to the scanning probe. The scanning probe scans the surface of the structure again to produce a second structure image. The first and second structure images are combined to produce best fit image of the surface area of the structure. The same method is used to produce the best fit image of a flat standard. The best fit image of the flat standard is subtracted from the best fit image of the structure to obtain a true topographical image in which Z direction run out error is substantially reduced or eliminated.

Growing community of inventors

Ellsworth, WI, United States of America

Peter John Gunderson