University of California

Technische Universitat Ilmenau

Synchrotron Soleil

Peter J Schuck

Ivo Rangelow

Jan Meijer

Eli Yablonovitch

Stefano Cabrini

Deirdre Olynick

Stefan Kubsky

Alexander Weber-Bargioni

Wei Bao

Mauro Melli

This disclosure provides systems, methods, and apparatus related to probes for multidimensional nanospectroscopic imaging. In one aspect, a method includes providing a transparent tip comprising a dielectric material. A four-sided pyramidal-shaped structure is formed at an apex of the transparent tip using a focused ion beam. Metal layers are deposited over two opposing sides of the four-sided pyramidal-shaped structure.

Probes for multidimensional nanospectroscopic imaging and methods of fabrication thereof

The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device.

Device and method for an atomic force microscope for the study and modification of surface properties

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Oakland, CA, United States of America

Peter J Schuck