Repligen Corporation

Wyatt Technology Corporation

Proterion Corporation

Peter Halatin

Charlie E Schwartz

David Anafi

Glen Ramsay

Richard Hall

Matthew Muller

Jeff MacDonald

Yusheng Zhang

A system may include a light source, to generate a probe signal, comprising incident radiation; an optical probe, to direct the incident radiation through a fluid sample; a motor, to move the optical probe along a probe axis, to change a path length of the incident radiation through the fluid sample; and a detector, to receive the incident radiation as attenuated radiation after passing through the fluid sample. The system may include a control system, arranged to: initiate an absorbance measurement by directing movement of the optical probe along the probe axis; direct the light source to emit the incident radiation; and automatically adjust at least one measurement parameter of a set of measurement parameters for the sample measurement, based upon a slope parameter m, wherein m is derived from a rate of change in an intensity of the attenuated radiation with a change in the path length.

Variable path length absorption spectrometer having automated continuous slope measurement

A method includes determining whether a variation in probe radiation intensity meets a stability criterion; directing the probe radiation through a probe, when the probe is disposed at a first position, defining a first path length Lof the probe radiation through the fluid sample; measuring a transmitted intensity Iof the probe radiation after passing through the fluid sample when the probe is disposed at the first position; directing the probe radiation through the probe when the probe is disposed at a second position, defining a second path length Lof the probe radiation through the fluid sample; measuring a transmitted intensity Iof the probe radiation after passing through the fluid sample when the probe is disposed at the second position; and determining a concentration C of a material in the fluid sample based upon L, I, L, and I, when the stability criterion is met.

No-ref-signal slope spectroscopic measurement

The invention relates to a surface plasmon resonance system method. The system has at least one light source operable to generate a source beam, a prism having a rear surface at least partially coated with a metallic coating and optionally a dielectric layer. At least one layer under test is positioned on the rear surface of the prism. The source beam is directed at the layer under test thereby defining an angle between the source beam and the rear surface of the prism. A detector is operable to detect light that is reflected or scattered by the layer under test. The source beam is directed towards the layer under test at a selected angle. The source beam is also shifted in at least one plane to illuminate a specific portion of the layer under test based on the selected relative angle and the position of the layer under test on the rear surface of the prism. The rear surface of the prism can be illuminated in one-dimensional or two-dimensional array like fashion.

Beam shifting surface plasmon resonance system and method

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Howell, NJ, United States of America

Peter Halatin