Advanced Inquiry Systems, Inc.

Teseda Corporation

Peter H Decher

Morgan T Johnson

Ajit M Limaye

Horst R Niehaus

A flexible extension wafer translator includes a wafer translator portion, one or more flexible connectors extending outwardly therefrom, and a connector tab coupled to the distal end of each outwardly extending flexible connector. The flexible connectors may take any suitable form, including but not limited to, draped and pleated.

Methods and apparatus for flexible extension of electrical conductors beyond the edges of a substrate

A modular tester architecture allows end-users to mix-and-match scan chain modules and clock driver modules. Modules are interconnected via a synchronization bus allowing the test modules to synchronize with each other so that each can perform its portion of the overall test at the proper time in relation to the testing performed by other modules. The modules can include a BIST driver module, a data acquisition module, networking interface modules, a controller module, a current measurement module, and a DC parametrics module, among others.

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Lake Oswego, OR, United States of America

Peter H Decher