X-rite Gmbh

Peter G VanderJagt

Steven Henry Peterson

Mark A Cargill

Zhiling Xu

David A Salyer

A color measurement device designed for use at various stages of an industrial process is provided. The device offers enhanced insensitivity to ambient light, measurement depth variations, and/or ambient or environmental temperature variations. The device may be embodied as an LED-based, non-contact color measurement spectrophotometer. Over-illumination in full-spectrum of the target object facilitates effective color measurements over varying depths of view. Collected light is measured at discrete wavelengths across the entire visual spectrum. The hardened, rugged design and packaging of the measurement device allows color measurement to be performed at various stages of industrial processes wherein the device can add value by enabling enhanced detection of color errors.

Industrially robust non-contact color measurement device

An LED-based color measurement instrument including an illumination system and a sensing system. The illumination system includes modulated LEDs and a temperature control system for regulating the temperature of the LEDs, thereby improving the consistency of their performance. The sensing system includes a photodiode, a transimpedance amplifier, and an integrator in the first stage to cancel the effect of ambient light on the output of the first stage. The sensing system also includes a lens system for imaging a target area of the target sample onto the photo sensor in a manner so that the product of the target area times the solid angle captured by the lens system is generally uniform over a selected range of distances, thereby reducing the positional sensitivity of the instrument with respect to the target sample.

Growing community of inventors

Belmont, MI, United States of America

Peter G VanderJagt