Apple Inc.

Kla Tencor Corporation

Lsi Corporation

Peter G Panagas

William R Wheeler

Amin Samsavar

Thomas Harding McWaid

Steven G Eaton

Ho-Ming Leung

Elliot Sowadsky

Suryanaryana M Potharaju

Giovanni Gozzini

Robert J Hill

Benjamin B Lyon

Jonathan M Haylock

Srdjan D Sobajic

Richard W Lim

A system for testing a first layer disposed over a capacitive sensing device includes a test probe having a substantially flat conductive test surface, a device under test (DUT) disposed over the capacitive sensing device, and a power supply operatively connected to the test probe. The DUT can include the first layer and one or more additional layers. The substantially flat conductive test surface is positioned over a surface of the DUT and applies power to the DUT. The capacitance between the test probe and at least one capacitive sensing element in the capacitive sensing device is then measured.

Testing a layer positioned over a capacitive sensing device

A test system may be provided in which devices under test are loaded into test trays and tested at a plurality of test stations. To test a device under test at a given test station, the test tray may be installed into a test fixture at the test station. Test equipment at each test station may communicate with the device under test via the test fixture and the test tray. Each test tray may have a spring-loaded corner portion that may be used to secure the device under test to the test tray. The test tray may have contacts that mate with corresponding contacts at each test fixture and may have a built in cable that connects to the device under test. The test fixture may have a detector that can detect whether or not a test tray is present on the test fixture.

Testing system with test trays

A test system may be provided in which devices under test are tested using radio-frequency test stations. A test station may include a test host, a test unit coupled to the test host, and a shielded enclosure. The shielded enclosure may contain a test antenna coupled to the test unit via a radio-frequency cable. A computer-controlled loading arm may be used to place a device under test on a positioner within the test enclosure. The test enclosure may have an enclosure door that is opened and closed using a computer-controlled pneumatic cylinder. When the enclosure door is closed, a portion of the enclosure door may actuate one or more levers on the positioner, which may in turn actuate one or more positioning arms to press the device under test against one or more guide surfaces on the positioner, thereby precisely positioning the device under test within the test enclosure.

Testing systems with automated loading equipment and positioners

An electronic device can include an inertial measurement unit (IMU) operative to monitor the movement of the electronic device. The IMU used in the device can be inaccurate due to the manufacturing process used to construct the IMU and to incorporate the IMU in the electronic device. To correct the IMU output, the electronic device in which the IMU is incorporated can be placed in a testing apparatus that moves the device to known orientations. The IMU output at the known orientations can be compared to an expected true IMU output, and correction factors (e.g., sensitivity and offset matrices) can be calculated. The correction factors can be stored in the device, and applied to the IMU output to provide a true output. The testing apparatus can include a fixture placed in a gimbal movable around three axes.

Inertial measurement unit calibration system

Calibration for three dimensional motion sensor

A method for transitioning a video system is disclosed. The method generally includes a first step for (A) executing in a processing circuit a standby code stored in a nonvolatile memory while the video system is in an off state, the off state defining a low power configuration for the processing circuit and a power off condition for the video system, the standby code being responsive to a plurality of wake up conditions to wake up the video system. In a second step, the method may (B) store an application code in a volatile memory while in the off state, the application code configured to operate the video system while in an on state of the video system. The method generally includes a third step for (C) transitioning from the off state to the on state upon detection of at least one of the wake up conditions. A step for (D) executing in the processing circuit the application code while in the on state to decode video may also exist in the method.

DVD recorder and PVR instant on architecture

A profiler or scanning probe microscope may be scanned across a sample surface with a distance between them controlled to allow the sensing tip to contact the surface intermittently in order to find and measure features of interest. The distance is controlled so that when the sensing tip is raised or lowered to touch the sample surface, there is no lateral relative motion between the tip and the sample. This prevents tip damage. Prior knowledge of the height distribution of the sample surface may be provided or measured and used for positioning the sensing tip initially or in controlling the separation to avoid lateral contact between the tip and the sample. The process may also be performed in two parts: a fast find mode to find the features and a subsequent measurement mode to measure the features. A quick step mode may also be performed by choosing steps of lateral relative motion to be smaller than 100 nanometers to reduce probability of tip damage. In this mode, after each vertical step to increase the separation between the tip and the sample, it is detected as to whether the tip and the sample are in contact. If they are still in contact after the vertical step, one or more vertical steps are taken to increase the separation, and no vertical step to reduce the separation is taken and no lateral relative motion is caused until it is determined that the tip and the sample are no longer in contact.

System for sensing a sample

Growing community of inventors

Santa Clara, CA, United States of America

Peter G Panagas