Leica Microsystems Cms Gmbh

Ernst Leitz Wetzlar Gmbh

Leica Microsystems Wetzlar Gmbh

Leica Mikroskopie Und Systeme Gmbh

Peter Euteneuer

Werner Knebel

Ralf Krueger

Heinrich Ulrich

Kyra Moellmann

Klaus Hermanns

Andreas Hund

Christian Schumann

Norbert Gaul

Hans-Werner Stankewitz

Guenter Reinheimer

Tobias Bauer

Ralf Krüger

Armin Pausch

Ute Gehrmann

Rolf Krueger

A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5&#xb1;7.5&#xb0;. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).

Microscope having a beam splitter assembly

An objective and an illumination unit for selectable generation of an orthoscopic beam path proceeding through the objective for pointlike scanning illumination, and of a conoscopic beam path proceeding through the objective for evanescent illumination of an object are disclosed. The illumination unit has a light source for generating illuminating rays along an illuminating beam path; a displacement unit for deflecting the illuminating beam path; a scanning eyepiece, placed after the displacement unit for focusing the illuminating rays into an image plane of the scanning eyepiece; and a mirror surface arranged in the image plane of the scanning eyepiece, having a transparent region for generating the orthoscopic beam path and having an at least partly reflective region facing toward the scanning eyepiece for generating the conoscopic beam path from the illuminating beam path, the image plane is located in a plane conjugated with the exit pupil.

Microscope for evanescent illumination and point-shaped raster illumination

A microscope includes: an objective turret holding a micro and a macro objective for rotation to operational positions along an optical axis; observation optics in an imaging beam path, and an illumination device including a beam splitter for generating an illumination beam path and coupling the illumination beam path into the imaging beam path, the macro objective including a first subsystem attachable to the objective turret, and a second subsystem insertable into the imaging beam path between the turret and the observation optics when the first subsystem is operational, the illumination device allowing a telecentric beam path with an illumination pupil produced by either the micro objective or the macro objective, and adjustment optics in the illumination beam path having positive refractive power and causing the illumination pupil to be shifted to a rear exit pupil, located between the first optical subsystem and the beam splitter, of the macro objective.

Microscope including micro and macro objectives

A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A coverslip that carries or covers the sample is arranged in the imaging beam path. A measurement beam is guided through the objective onto the sample in a decentered fashion that is outside an optical axis of the objective. The measurement beam is reflected at an interface of the coverslip with the sample and the reflected measurement beam is guided through the objective onto a detector. An intensity profile of the reflected measurement beam is detected with the detector and a presence of a spherical error from the intensity profile is determined qualitatively and/or quantitatively.

Method and apparatus for identifying and correcting spherical aberrations in a microscope imaging beam path

An inverted microscope for the high-contrast imaging of objects includes multiple objectives configured to be disposable in an imaging beam path. Each objective has a respective objective pupil associated therewith. A lens system is also provided for generating respective intermediate images of the respective objective pupils. A modulator disposing device, which includes a plurality of modulators, is configured to dispose the modulators at predetermined respective locations on an optical axis corresponding to the locations of the respective intermediate images of the respective objective pupils so as to contrast an object image.

Inverted microscope for high-contrast imaging

A tube for a microscope includes an adaptation interface, a rotatable operator interface, a beam deflecting device, and a rotatable beam deflecting unit. The beam deflecting device includes a beam-splitting device. A rotation of the operator interface is constrainedly coupled to a rotation of the beam deflecting unit. The beam deflecting device deflects, in the direction of the beam deflecting unit, a light beam coming from the adaptation interface.

Tube for a microscope

The application relates to an ergonomic tube for a microscope. A binocular head is provided on the tube. A deflection element is provided in the tube and a deflection mirror is assigned to the element, the mirror being located behind the optical path of the lens, when viewed from the user's position. A single tube-lens system is positioned in the optical path of the tube. A modification to the inclination of the oclar optical path in relation to the horizontal (H) by a value &#x3b1;causes the position of the deflection mirror to be modified by an angle &#x3b1;/2.

A microscope comprises an objective and a light source that produces an illumination light beam&#x2014;in particular for evanescent illumination of a sample, which exhibits a focus in the plane of the objective pupil. To adjust the penetration depth, an adjustment mechanism is provided with which the spatial position of the focus within the plane of the objective pupil may be changed.

Objective for evanescent illumination and microscope

A microscope with evanescent sample illumination comprises a device for optically manipulating a sample.

Microscope with evanescent sample illumination

A tube for a microscope includes a tube housing, an adaptation interface, a beam guidance device, an operator interface, and a beam deflecting device. The beam deflecting device deflects a light beam coming from the adaptation interface so that the optical axis of the light beam extends in a plane and is guided by the beam guidance device to the operator interface. The tube housing, together with the beam guidance device and the operator interface, is movable relative to the microscope in a direction parallel to the plane.

The present invention concerns a microscope and an illumination device for a microscope that ensure optimal illumination in the standard (10&#xd7;&#x2013;100&#xd7;), scanning (1.6&#xd7;&#x2013;5&#xd7;), and macro (1&#xd7;&#x2013;1.6&#xd7;) ranges. The illumination system comprises only one condenser head that can be switched in or out and that can optimally illuminate the entire range from 1&#xd7; to 100&#xd7;, and a movably arranged focusing lens that ensures optimal adaptation of the illumination to the entrance pupil for all ranges.

Transmitted-light illumination device for a microscope

Condenser system for microscopes

A modular device (5) for an optical device, such as a microscope (1), is described. This device has adjacently disposed mountings (24a, 24b) for optical systems which can be introduced alternately into the illumination beam path (2) or optical axis (2a) of the microscope by use of a pull rod (11) provided on the modular device (5). At least one of the mountings (24a) is capable of being uncoupled from the pull rod (11), so that the relative spacing of two mountings (24a, 24b) can be altered. Additionally an optical element (17), for example, a compensating plate disposed in the microscope, can be pivoted into the optical axis (2a). By using the modular device (5), a rapid switch-over from traditional methods of microscopy to, for example, investigations utilizing fluorescence microscopy and vice versa, without any effect on the image section and the image sharpness, is possible without undertaking adapting operations or reconstructing the microscope.

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Lahnau, Germany

Peter Euteneuer