Agilent Technologies, Inc.

Peter Egerton

Kenneth R Wildnauer

Gary Wang

Zoltan Azary

Paul S Bussard

Improved calibration of optical wavelength measuring instruments. In a first embodiment, improved calibration is achieved in an optical wavelength measuring instrument by performing calibration measurements at a plurality of known wavelengths and using an average calibration constant derived from the plurality of measurements. In a second embodiment, improved calibration is achieved by performing calibration measurements at a plurality of known wavelengths and calculating a linear or higher order calibration model, or a periodic model. These approaches may be extended by segmenting the wavelength range and using different calculated calibration values, or different calibration models, for each segment.

Multipoint wavelength calibration technique

Wavelength reference standard using multiple gasses and calibration methods using same. A wavelength reference using absorption lines of multiple gasses provides stable reference wavelengths over multiple regions of interest of the optical spectrum. The gasses may be in separate cells or combined in one cell. Improved calibration using the reference is achieved by performing calibration measurements at a plurality of known wavelengths and using an average calibration constant derived from the plurality of measurements. In a second embodiment, improved calibration is achieved by performing calibration measurements at a plurality of known wavelengths and calculating a higher order calibration model, such as a least-squares linear fit. Both approached may be extended by segmenting the wavelength range and using calculated calibration values for each segment.

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Santa Rosa, CA, United States of America

Peter Egerton