Promet International, Inc.

Fenwal, Inc.

Honeywell International Inc.

Peter David Koudelka

Lubomir Koudelka

Eric Karl Lindmark

Ryan Elliot Eckman

William Henry Cork, Iii

Steven R Katz

James Joseph Ulmes

Ryan Eliot Eckman

Steven M Arnold

Jan Jelinek

Alan Blair

Daniel Blitz

Ryan Eckman

Blood separation systems and methods are provided for controlling the interface between separated blood components. The system includes a centrifuge assembly having a light-transmissive portion, a light reflector, and a fluid processing region therebetween. An optical sensor system emits a scanning light beam along a path toward the light-transmissive portion, which transmits at least a portion of the scanning light beam to the fluid processing region and the light reflector. The light reflector reflects at least a portion of the scanning light beam toward the optical sensor system along a path substantially coaxial to the path of the scanning light beam from the optical sensor system toward the light-transmissive portion of the centrifuge assembly. The scanning light beam may be a white light beam or narrow spectrum beam. The reflected beam may be directed through the optical sensor system via optical fibers.

Interface detector for blood processing system

An inspection system includes optical components for operating the inspection system in an interference fringe imaging mode and a microscope imaging mode. The inspection system further includes at least one optical light source configured to emit a first wavelength of light to operate the inspection system in the interference fringe imaging mode and configure to emit a second wavelength of light to operate the inspection system in the microscope mode. The first wavelength of light is different from the second wavelength of light.

Multifunction solid-state inspection system

An optical probe has optical components of an interferometer and includes an optical axis, at least one optical source for emitting light along an illumination path that is at least partially coaxial with the optical axis, a first beam splitter and a first lens. The first beam splitter intersects the optical axis and splits the light from the at least one optical source into a first beam for traveling along a reference path that is coaxial with the optical axis to a reference surface and a second beam for traveling along a test path that is coaxial with the optical axis to a specimen. The first lens is interposed along the reference path.

Coaxial interferometer and inspection probe

A computing system includes an interferometer and a processor. The interferometer is configured to generate at least two phase shifted images of an optical fiber specimen. The processor is configured to acquire the at least two phase shifted images from the interferometer, generate a first intermediate data set based on the at least two acquired phase shifted images and perform two-dimensional defect detection on the first intermediate data set.

Defect detection on optical fiber specimen using 3D surface data

A swept distance between a subject and a plurality of cameras provides a plurality of raw images. Focused portions of the raw images are fused to generate a synthetic image and a distance image. A projection of the synthetic image and the distance image yields a panoramic image.

Optical fingerprint acquisition

An optical inspection system includes an optical inspection device and an interface. The optical inspection device houses optical imaging components that acquire microscope visual images and acquire interference fringe images of a plurality of optical specimens along an optical path. The optical path is located along an optical axis of the optical inspection device. The interface is coupled to the optical inspection device and is configured to removably engage a polishing work holder that supports the plurality of optical specimens. The interface allows an optical specimen axis of each of the plurality of optical specimens and the optical axis of the optical inspection device to be aligned.

Optical inspection of optical specimens supported by a work holder

The present invention provides an inspection system for inspecting a surface of an optical specimen. The inspection system includes an optical testing device having a main body and an optical axis. The optical testing device includes an optical imaging system housed in the main body. The optical imaging system includes imaging components for acquiring a microscope visual image and for acquiring at least one interference fringe image of the surface of the optical specimen. The optical testing device also includes a translational mechanism housed in the main body and configured to allow linear movement of the optical imaging system and to prevent off-axis movement of the optical imaging system.

Growing community of inventors

Saint Paul, MN, United States of America

Peter David Koudelka