Sarnoff Corporation

Sharp Corporation

Peter Daryl Gardner

Leslie Ronald Avery

An electrostatic protection (ESD) circuit for an integrated circuit (IC) includes a string of a plurality of diodes connected between a Vss line and a Vdd line. A first PMOS transistor and a first NMOS transistor are connected in series between the Vdd line and the string of diodes. The first PMOS transistor has a gate connected between two of the diodes of the string, and the NMOS transistor has a gate connected to the Vdd line. A second PMOS transistor and a second NMOS transistor are connected in series between the Vss line and the Vdd line with the PMOS transistor having a gate connected to the junction between the first PMOS transistor and the first NMOS transistor and the second NMOS transistor having a gate connected to the Vdd line. A clamp NMOS transistor is connected between the Vss line and the Vdd line and has a gate connected to the junction between the second PMOS transistor and the second NMOS transistor. A diode may be connected between the Vdd line and the second PMOS transistor.

Adjustable trigger voltage circuit for sub-micrometer silicon IC ESD protection

A crisscross level shifter comprising a pull-down circuit configured as a pair of cascode amplifiers and a crisscross pull-up circuit. The cascode amplifiers are enhanced by a feedforward circuit coupling, for both amplifiers, the input of one cascode amplifier to the output of the other cascode amplifier.

Growing community of inventors

Lubec, ME, United States of America

Peter Daryl Gardner