Leica Microsystems (schweiz) Ag

Peter Bertschi

Peter Soppelsa

Heinz Zimmerman

Wolfgang Bruehl

Danilo Parlatano

Roman Gerster

Ruedi Rotterman

A stereomicroscope system () having an incident illumination device is disclosed. The stereomicroscope system () comprises a base () on which a focusing column () is secured. Mounted shiftably on the focusing column () is a focusing arm () which has an opening that serves to receive a stereomicroscope (). The stereomicroscope () defines a device axis () that is perpendicular to the base (). Multiple light-emitting diodes () are arranged in the focusing arm () around the receiving opening (). Multiple light-emitting diodes () are likewise arranged along the focusing arm () between the focusing column () and the receiving opening ().

Stereomicroscope system having an incident illumination device

A stereomicroscope having a carrier () bearing a microscope body () displaceable obliquely relative to a displacement direction of a focus-adjusting mechanism (). A binocular beam splitter () is used to combine two stereoscopic observation beam paths () into a common beam path (), wherein the axes of the two observation beam paths () entering into the binocular beam splitter () and the axis of the beam path () emerging from the binocular beam splitter () are parallel to each other, and the axis of the emerging beam path () is disposed at displacement (Vs) from a symmetry axis of the two entering observation beam paths (). Displacement of the carrier being able to compensate for displacement (Vs). A switching device () is provided that can be activated to bring lenses () over an object () parfocally and parcentrically.

Stereomicroscope or additional element for a stereomicroscope

A method of calibrating the magnification of a stereomicroscope having variable magnification comprises the steps of (A) positioning an object reference measure () with a known scaling in an object plane () of the stereomicroscope; (B) providing an eyepiece reference measure () of known scaling in an intermediate image plane () of the stereomicroscope; (C) varying the magnification of the stereomicroscope using a zoom system () thereof so that an image of the object reference measure () is brought into optical alignment (coincidence) with the eyepiece reference measure () in the intermediate image plane () in order to determine a zoom position of the zoom system () corresponding to this alignment; (D) determining an actual magnification of the stereomicroscope in the zoom position on the basis of a lateral magnification defined by the scalings of the object reference measure () and eyepiece reference measure () which have been brought into alignment; (E) determining a nominal magnification of the stereomicroscope in the zoom position; (F) correlating the actual magnification and nominal magnification by computer; and (G) calculating magnifications for other zoom positions using the computer correlation of nominal magnification and actual magnification.

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Altstätten, Switzerland

Peter Bertschi