Malvern Panalytical Inc.

Peter Bennett

E Neil Lewis

John McCaffrey

Vishal Patil

Kevin Dahl

Ken Haber

Gerald Sando

Tomasz Sadowski

An apparatus () for characterizing particles, comprising: a microscope objective with an optical axis and a depth of field; a holder cell () configured to position the particles in a generally planar volume below the microscope objective, the planar volume being substantially normal to the optical axis and having a depth that is less than or equal to the depth of field, wherein a portion of the cell holder () for positioning in the optical axis of the microscope objective is substantially free of significant spectral features in a Raman spectral range; an x-y stage () to move the microscope objective relative to the holder cell () in x and y directions to align particles with the optical axis of the microscope objective while the particles are held by the holder cell (), a detector () for acquiring an image of a particle through the microscope objective, a laser operable to illuminate a particle held by the holder cell (), a Raman spectrometer () arranged to obtain a spectrum including the Raman spectral range from the illuminated particle, and characterizing logic operative to characterize the particle based on image processing operations performed on the acquired image and based on the Raman spectrum. The holder cell () comprises a first plate () and a second plate () that are separated by a predetermined distance defining the planar volume depth.

Suspended particle characterization system

The disclosure relates to methods and device for detecting properties of heterogeneous samples, including detecting properties of particles or fluid droplets in industrial processes. A probe may be inserted into a first of multiple heterogeneous fluid samples. A portion of the first sample may be drawn into the probe and past a two-dimensional array detector. The portion of the first sample may be illuminated as it is drawn past the array detector and an image of the portion of the first sample may be acquired. The probe may be inserted into a second of multiple heterogeneous fluid samples. A portion of the second sample may be drawn into the probe and past a two-dimensional array detector. The portion of the second sample may be illuminated as it is drawn past the array detector and an image of the portion of the second sample may be acquired.

Heterogeneous fluid sample characterization

Growing community of inventors

Columbia, MD, United States of America

Peter Bennett