Koninklijke Philips Corporation N.v.

Peter Benjamin Theodor Nöel

Thomas Koehler

Andriy Yaroshenko

Lukas Benedict Gromann

Konstantin Willer

Fabio De Marco

The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector () is arranged opposite an X-ray source () across an examination region () with a grating arrangement () arranged between the X-ray source () and the X-ray detector (). During an imaging operation without an object in the examination region () the grating arrangement () is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector () whilst the X-ray detector () remains stationary relative to the examination region () such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device ('&#x2033;) with less scanning motions.

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Unterfohring, Germany

Peter Benjamin Theodor Nöel