Keithley Instruments, Inc.

Pete Hulbert

Gregory Sobolewski

Rajat Mehta

Michael D Rayman

John Lilie

Trish Gottlob

Dave Rubin

A method and apparatus for generating a desired pulse waveform including: dividing the desired pulse waveform into a plurality of line segments; assigning to each line segment at least a segment identification, a segment initial value, and a segment duration to form a waveform description; providing the waveform description to a pulse generator. The pulse generator is operable to produce a waveform corresponding to the waveform description and to output the produced waveform.

Method and apparatus for pulse generation

A method for operating a measurement system having an interconnect between the measurement system and a device under test (DUT), the interconnect exhibiting voltage drops during measurements of the DUT, includes applying a test signal to the DUT through the interconnect, the test signal having a system value at the measurement system; measuring a resulting DUT value at the DUT; adjusting the system value according to the resulting DUT value to produce successive desired DUT values at the DUT; and using the successive DUT values to measure an electrical characteristic of the DUT.

Method for load-line correction of pulsed measurements

A system for making HF and DC measurements on a DUT includes a HF unit having a HF connection terminal that is switchable to a connected or disconnected state; a DC unit having a DC connection terminal that is switchable to a connected or disconnected state; and a common connection between the connection terminals adapted to be connected to the DUT. The DC connection terminal has a transmission line characteristic that is impedance-matched to minimize reflections when the HF connection terminal is in the connected state and the DC connection terminal is in the disconnected state.

Combined pulse and DC test system

The errors related to the resistance of test conductors and sense/load resistances for a pulse I-V measurement system are determined by making open circuit and through circuit measurements using a combination of DC and pulse instrument measurements.

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Cleveland, OH, United States of America

Pete Hulbert