Huawei Technologies Co., Limited

Petar Ivanov Krotnev

Davide Tonietto

Marc-Andre Lacroix

Henry Wong

Ehud Nir

Devices and methods are provided for performing a high-frequency jitter self stress check on a receiver to assist with optimization. High-frequency jitter is injected into a clock signal recovered from a received data signal and used to sample the data signal. The injected jitter increases the bit error rate (BER), making BER a more useful and quicker optimization metric in applications using low-noise communication links. Error correction is used to maintain acceptable output BER while the self stress check is in progress.

Serdes with jitter injection self stress mechanism

A method includes deactivating transmitters of a first plurality of transceivers that are associated with an endpoint to multi-channel communication fabric. A given transceiver of the first plurality of transceivers includes a receiver. The method includes controlling the given transceiver to cause the given transceiver to couple a reference source of the given transceiver to a first node of the receiver, measure a first value at a second node of the receiver, and determine a gain between the first node and the second node based on the measured first value. The method includes controlling the given receiver to cause the given receiver to isolate the reference source from the first node of the receiver; and measuring, by the given transceiver, a second value at the second node and determining, by the given transceiver, an intrinsic noise based on the measured second value. The method includes activating the deactivated transmitters; measuring, by the given transceiver, a third value at the second node and determining, by the given transceiver, a composite noise based on the measured third value; and determining, by the given transceiver, a crosstalk noise at the first node of the receiver based on the determined gain, the determined intrinsic noise and the determined composite noise.

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Ottawa, Canada

Petar Ivanov Krotnev