Asml Netherlands B.v.

Pertrus Rutgerus Bartray

Marc Wilhelmus Maria Van Der Wijst

Erik Roelof Loopstra

Wilhelmus Josephus Box

Bernardus Antonius Johannes Luttikhuis

Gerard Van Schothorst

Johan Juliana Dries

Martinus Hendrikus Antonius Leenders

Paulus Martinus Maria Liebregts

Dominicus Jacobus Petrus Adrianus Franken

Michael Jozef Mathijs Renkens

Michael Jozefa Mathijs Renkens

Mustafa Amhaouch

Franciscus Catharina Bernardus Marinus Van Vroonhoven

Michael Ten Bhomer

Angelo Alexander Michael Van Engelen

Tim Anton Johan Meesters

Dominicus Jacobus Petrus A Franken

Mark Wilhelmus Maria Van Der Wijst

A lithographic apparatus includes a projection system mounted on a reference frame, which in turn is mounted on a base which supports the apparatus. Vibrations and displacement errors in the base are filtered through two sets of isolation mounts operatively between the base and reference frame and between the reference frame and a projection frame of the projection system and therefore disturbance of the projection system is reduced.

Lithographic apparatus and device manufacturing method

A lithographic apparatus includes an illumination system for providing a beam of radiation. The lithographic apparatus further includes: a support structure for supporting patterning device, the patterning device serving to impart the beam with a pattern in its cross-section; a substrate table for holding a substrate; and a projection system for projecting the patterned beam onto a target portion of the substrate. The lithographic apparatus includes a vacuum system in which at least the illumination system and the substrate table are present. The vacuum system includes at least two separate vacuum modules. A first vacuum module includes at least the projection system and/or the illumination system. A second vacuum module includes the substrate table. At least two of the vacuum modules are connected to each other via a closable connection.

Lithographic apparatus and method of manufacturing a device and method of performing maintenance

A lithographic apparatus is disclosed. The apparatus includes an illumination system that provides a beam of radiation, and a support structure that supports a patterning structure. The patterning structure is configured to impart the beam of radiation with a pattern in its cross-section. The apparatus also includes a substrate support that supports a substrate, a projection system that projects the patterned beam onto a target portion of the substrate, and a reference frame that provides a reference surface with respect to which a position of at least one of the substrate and the patterning structure is measured. The reference frame includes a material that has a coefficient of thermal expansion of greater than about 2.9&#xd7;10/K.

A lithographic apparatus includes an illumination system for providing a beam of radiation, a support structure constructed to support a patterning device, which serves to impart the projection beam with a pattern in its cross-section, a substrate table for holding a substrate, a projection system that projects the patterned beam onto a target portion of the substrate, and a reference frame with a position sensor and the substrate being located thereon. The apparatus further includes a heat transport system having a heating element, in thermal interaction with at least one of the projection system and the reference frame, for heat transport to or from at least one of the projection system and the reference frame, wherein the heat transport system, is coupled to a further frame which is mechanically isolated from the reference frame.

Growing community of inventors

Ysselsteyn, Netherlands

Pertrus Rutgerus Bartray