Heraeus Deutschland Gmbh & Co Kg

Per Soerensen

David Francis Lupton

Nicole Staudt

Reinhold Weiland

Ingo Prunzel

A probe pin (') for electronic testing of semi-conductor elements is provided. The pin contains an electrically conductive core element () made up of a metallic alloy, and an electrically insulating jacket element () which surrounds the core element () over regions thereof. The core element () contains a distal contact section () for electrical contacting to a semi-conductor element. The metallic alloy of the core element contains at least 67% by weight rhodium, 0.1% by weight to 1% by weight zirconium, up to 1% by weight yttrium, and up to 1% by weight cerium. A method for producing a probe pin is also described.

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Langenselbold, Germany

Per Soerensen