Orbit Advanced Technologies, Inc.

Microwave Vision

Ste D'applications Technologiques De L'imagerie Micro-onde

Ste D'applications Technologiques De L'imagerie Micro Ondes

Ste D'applications Technologies De L'imagerie Micro Ondes

Per Iversen

Luc Duchesne

Philippe Garreau

Arnaud Gandois

William P Campbell

Zachary John Pelli

Thomas D Kauffman

Thomas P O'Donnell

Thomas McKeown

Ludovic Durand

John F Aubin

Virginie Tessier

Jérôme Drean

Nicolas Robic

Edmund Lee

Brian C Jackson

Russell Jay Soerens

Edward Szpindor

Vincent Keenan

Jerome Drean

A mechanical means for deploying one of two or more feed sources within a test range is presented. The feed source selected for testing is properly positioned for use within the range by rotating one of two or more arms to an upright and locked position. An arm may further include a rotatable antenna wheel with two or more feed sources thereon whereby a selected feed source is rotated into position via the antenna wheel. The antenna wheel includes a center body, feed sources attached to the center body and aligned along a rotational plane, and a shroud disposed about the center body and feed sources. The antenna wheel may include a cooling system for managing heat generated by the feed sources and electronics therefore. In preferred embodiments, the feed source changer is mounted within the range so that a selected feed source communicates an emitted beam onto a reflector which is redirected as a reflected beam toward a device under test. Concealment panel(s) may be positioned adjacent to the feed source changer to minimize electromagnetic reflections therefrom.

Automated feed source changer for a compact test range

A portable near-field measurement system for mapping radio frequency characteristics spherically about a test object is presented. The system includes an anechoic chamber, a rotatable annular platter, a rotatable platter, a stationary platform, and frequency converters. The chamber is an enclosure with an absorber material fastened to the interior thereof. The annular platter is disposed horizontally within the chamber and fastened to an azimuth positioner that rotates the annular platter about an azimuth rotation axis. The rotatable platter is disposed vertically within the chamber and rotatable about an elevation rotation axis via an elevation positioner. Azimuth and elevation axes intersect perpendicularly. A gantry arm with probe is fastened to and extends from the rotatable platter. A vertical arm is fastened between the annular platter and elevation positioner. Platters have front and back surfaces. A stationary platform is centered within the annular platter and attachable to a test column. Front surfaces are oriented toward the test column and covered with an absorber material. At least one frequency converter is fastened to the back surface of the rotatable platter and communicable with the probe. At least one other frequency converter is fastened to the stationary platform and communicable with a target.

Portable spherical near-field antenna measurement system

The invention relates to a device () for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (), characterized in that it comprises a means () for sliding said probe network () on itself with a relative offset between the probe network () and the object being tested, that is higher than the pitch of the probe network () in order to carry out measurements along a plurality of relative positions of the probe network () and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network () relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.

Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested

A device () for the relative positioning of an electromagnetic probe network () and of an object being tested (). The device includes at least a sliding element () to provide for the relative sliding of the object being tested () or of the electromagnetic probe network (), to move the object being tested () or the probe network () along at least one sliding direction included in a plane of the probe network (), and on which is provided a rotation device () for the relative rotation of the object being tested () and of the probe network () about a main rotation axis perpendicular to the sliding direction.

Determination of at least one value associated with the electromagnetic radiation of an object under test

The invention relates to a device for controlling a material, the device including at least one transmitter for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and one receiver for receiving the electromagnetic signal, wherein the device further includes a first modulator for modulating the electromagnetic signal at a frequency Fm1, the first modulator being arranged, on the signal path, between the transmitter and the material in order to spatially sample the emitted electromagnetic signal; second modulator for modulating the electromagnetic signal at a frequency Fm2, the second modulator being arranged, on the signal path, between the material and the electromagnetic signal receiver in order to spatially sample the electromagnetic signal passed through the material.

Microwave device for controlling material

An apparatus for studying the electromagnetic behavior of an electromagnetic wave-emitting or electromagnetic wave-receiving tool is provided. An anechoic chamber is configured to receive the tool as well as a person handling the tool. At least one analysis antenna is configured to pick-up the electromagnetic waves emitted from or received by the tool. Signals outputted by the analysis antenna are processed, and a radiation diagram associated with the electromagnetic tool is displayed. The radiation diagram is displayed inside the anechoic chamber so that the person handling the electromagnetic tool observes how the handling of the tool affects its electromagnetic behavior.

Anechoic chamber for direct observation of the electromagnetic behavior of a tool

A device determines at least one characteristic of electromagnetic radiation emitted from a test object. A support receives the object. A network of probes is distributed along a substantially circular arc, and the support is disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes. The network of probes or the support is pivoted in the plane formed by the network of probes or in the plane parallel to the plane formed by the network of probes about a point located in that plane to vary an angle formed between a given one of the network of probes and the support, and thereby allow measurements to be taken at plural angular positions of the network of probes relative to the test object.

Device and method for determining at least one variable associated with the electromagnetic radiation of an object being tested

Growing community of inventors

Doylestown, PA, United States of America

Per Iversen