Chinese Academy of Sciences

Neusoft Corporation

Peng Yu

Lianqing Liu

Jialin Shi

Wenyan Mu

Minggang She

Xin Zhang

The disclosure relates to an image detection method, a readable storage medium and a vehicle. The method includes: obtaining a to-be-detected image; determining related information of a target image in the to-be-detected image, where the target image is an image capable of being projected onto a vehicle windshield for display through a projection device; and determining whether the to-be-detected image is an abnormal image according to the related information of the target image.

Image detection method, non-transitory computer-readable storage medium and vehicle

A device capable of simultaneous independent motion measurement of multiple probes in an atomic force microscope includes at least two cantilever arms arranged in parallel. The end of each cantilever arm is provided with a needle tip. The surface of each cantilever arm is provided with a grating structure with a periodic distribution rule for reflecting laser irradiated on the grating structure and receiving the laser through reflected light detectors. The discrimination and motion measurement includes the steps of irradiating the measurement laser of different wavelengths on the back surfaces of multiple probes through the same light path at the same time, adopting the grating structures of different feature sizes as physical labels of the multiple probes and reflecting high-order reflected light of the laser of different wavelengths by the grating structures at different angles to separate the light path.

Method and device for simultaneous independent motion measurement of multiple probes in atomic force microscope

An atomic force microscope has dual probes composed of a hinge structure, two cantilever beams and needle tips arranged on free ends of the cantilever beams. The hinge structure is a U-shaped body having two ends respectively extended with a first cantilever beam and a second cantilever beam. The free end of the first cantilever beam and the free end of the second cantilever beam are respectively provided with a first needle tip and a second needle tip. The integrated dual probes is operated by the driving function of the probe clamp. Therefore, only a set of motion control and measurement system of the atomic force microscope is required to realize the rapid in-situ switching function of the dual probes.

Growing community of inventors

Liaoning, China

Peng Yu