Peking University

Peng Xi

Qionghai Dai

Shan Jiang

Hui Qiao

Kebin Shi

Wentao Yu

Qihuang Gong

A direct structured illumination microscopy (dSIM) reconstruction method is provided. First, a time domain modulation signal is extracted through a wavelet. Then, an incoherent signal is converted into a coherent signal. Next, an accumulation amount at each pixel is calculated. Finally, a super-resolution image is generated by using a correlation between signals at different spatial positions. An autocorrelation algorithm of dSIM is insensitive to an error of a reconstruction parameter. dSIM bypasses a complex frequency domain operation in structured illumination microscopy (SIM) image reconstruction, and prevents an artifact caused by the parameter error in the frequency domain operation. The dSIM algorithm has high adaptability and can be used in laboratory SIM, nonlinear SIM imaging systems, or commercial systems.

Direct structured illumination microscopy reconstruction method

A stimulated-emission-depletion (STED) super-resolution microscope includes an excitation light source, a depletion light source, an excitation light expanded beam alignment system, a spiral-shaped phase plate, a Bessel beam generating system, a depletion light focus lens, a beam combination system, an objective lens, a piezoelectric scanning system, a filter, a signal collection system, and a single-photon detector. The depletion light can be a first-order Bessel beam. The depletion light has anti-scattering and self-healing characteristics, and is capable of keeping the spot shape at a deeper position of a sample, thereby improving image resolution in the deep region of the sample. Compared to conventional STED super resolution microscope of deep-layer imaging using an adjustable correction collar, the present invention is simpler in experimental operations and does not require active adjustments. Compared to adaptive optical systems, the present experimental apparatus is simpler and less expensive.

STED super-resolution microscope and adjusting method based on a first-order Bessel beam

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Beijing, China

Peng Xi