International Business Machines Corporation

Peng Peng

David James Hathaway

Bhavna Agrawal

David Wells Winston

Pravin Kamdar

Karl K Moody, Iii

Disclosed are embodiments of a system and of an associated method for estimating the leakage current of an electronic circuit. The embodiments analyze a layout of an electronic circuit in order to identify all driven and non-driven nets within the electronic circuit, to identify all of the driven net-bounded partitions within the electronic circuit (based on the driven and non-driven nets), and to identify, for each driven net-bounded partition, all possible states of the electronic circuit that can leak. Then, using this information, the embodiments estimate the leakage current of the electronic circuit. This is accomplished by first determining, for each state of each driven net-bounded partition, a leakage current of the driven net-bounded partition and a probability that the state will occur in the driven net-bounded partition during operation of the electronic circuit. Then, for each state of each driven net-bounded partition, the leakage current of the driven net-bounded partition and the state probability are multiplied together. The results are then aggregated.

System and method for estimating leakage current of an electronic circuit

A method of estimating a leakage for a plurality of transistors in an integrated circuit that accounts for narrow channel effects includes determining an expected total leaking transistor width for the collection; determining an expected total number of leaking transistors for the collection; determining an average width of a leaking transistor from the expected total leaking transistor width and expected total number of leaking transistors; estimating a leakage for a transistor of the average width; and determining the estimated leakage for the collection of transistors by multiplying the leakage for a transistor of the average width by the expected total number of leaking transistors for the collection.

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Peng Peng