Growing community of inventors

College Station, TX, United States of America

Peng Li

Average Co-Inventor Count = 3.79

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 34

Peng LiRajit Chandra (2 patents)Peng LiXin Liang Li (2 patents)Peng LiHung-Jue Sue (2 patents)Peng LiLarry Pileggi (2 patents)Peng LiMehdi Asheghi (2 patents)Peng LiYang Xu (1 patent)Peng LiLawrence Thomas Pileggi (1 patent)Peng LiMasahiro Miyamoto (1 patent)Peng LiRiichi Nishimura (1 patent)Peng LiShinsuke Akao (1 patent)Peng LiLawrence Piileggi (1 patent)Peng LiMinhao Wong (1 patent)Peng LiPeng Li (6 patents)Rajit ChandraRajit Chandra (22 patents)Xin Liang LiXin Liang Li (15 patents)Hung-Jue SueHung-Jue Sue (12 patents)Larry PileggiLarry Pileggi (5 patents)Mehdi AsheghiMehdi Asheghi (3 patents)Yang XuYang Xu (54 patents)Lawrence Thomas PileggiLawrence Thomas Pileggi (33 patents)Masahiro MiyamotoMasahiro Miyamoto (12 patents)Riichi NishimuraRiichi Nishimura (9 patents)Shinsuke AkaoShinsuke Akao (3 patents)Lawrence PiileggiLawrence Piileggi (1 patent)Minhao WongMinhao Wong (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Kaneka Corporation (2 from 1,700 patents)

2. The Texas A&m University System (2 from 1,238 patents)

3. Carnegie Mellon University (2 from 1,123 patents)

4. Gradient Design Automation Inc. (2 from 14 patents)


6 patents:

1. 10259948 - Coating compositions and coating products made therefrom

2. 9321919 - Surface-modified, exfoliated nanoplatelets as mesomorphic structures in solutions and polymeric matrices

3. 8082137 - Method and apparatus for thermal modeling and analysis of semiconductor chip designs

4. 7908131 - Method for parameterized model order reduction of integrated circuit interconnects

5. 7653524 - Analog and radio frequency (RF) system-level simulation using frequency relaxation

6. 7401304 - Method and apparatus for thermal modeling and analysis of semiconductor chip designs

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12/7/2025
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