Chengdu Boe Optoelectronics Technology Co., Ltd.

Boe Technology Group Co., Ltd.

Beijing Boe Technology Development Co., Ltd.

Jiangsu University

Peng Cao

Wei Zhang

Yifan Yang

Ming Zhao

Wei Chen

Long Chen

Jinyu Li

Jianchang Cai

Longhui Xue

Cheng Zeng

Wanmei Qing

Yamin Yang

Yingchang Gao

Jianchao Zhang

Guang Jin

Yishu Cao

Zeming Wang

Ying Bai

A pixel array, a display apparatus and a fine metal mask are provided. The pixel array includes first basic pixel units in odd-numbered rows and second basic pixel units in even-numbered rows; each first basic pixel unit includes first, second and third sub-pixel groups sequentially in a row direction; each second basic pixel unit includes the third, first and second sub-pixel groups sequentially in the row direction; the first, second and third sub-pixel groups include two first, two second and two third sub-pixels in a column direction, respectively; the first, second and third sub-pixels have different colors; the first and second basic pixel units in the even-numbered and odd-numbered rows are aligned in the column direction, respectively; in the first and second basic pixel units in two adjacent rows, the third sub-pixel groups in the two rows are staggered with each other in the row direction.

Pixel array, display apparatus and fine metal mask

A pin-on-plate friction and wear test device includes a high temperature heating chamber and a cooling pin. The high temperature heating chamber is fastened horizontally to the mobile base. The axis of the cooling pin is perpendicular to the upper surface of the mobile base. The electric resistance heating plate is located in the bottom closed space under the friction sample plate in the high temperature heating chamber. The electric resistance heats the fixed sample to experiment temperature. The inner layout of pin is a circling cooling channel where the cooling medium adjusts and cools the temperature of the sample. Thermocouples are separately distributed in the temperature measuring groove of the high temperature heating chamber and the temperature measuring hole of the cooling pin for real-time temperature measurement. The device can simulate the friction and wear properties of the high-strength steel plate and hot-stamping die in the differential temperature environment.

Friction and wear test device with pin-on-plate differential temperature distribution and self-adaptive adjustment

The display substrate may include a base substrate, a plurality of sub-pixels in an array on the base substrate, an isolation layer on a side of a second electrode layer opposite from the light-emitting layer, and an auxiliary conductive layer on a side of the isolation layer opposite from the second electrode layer. The isolation layer may comprise via openings, orthographic projection of each of the via openings on the base substrate may substantially overlap with orthographic projection of the pixel defining layer on the base substrate, and the auxiliary conductive layer may be connected to the second electrode layer through the via openings.

Display substrate, manufacturing method thereof, and display panel

A substrate includes a first base, a pixel defining layer and spacers. The pixel defining layer disposes above the first base and has a plurality of openings. The pixel defining layer includes a first pixel defining sub-layer and a second pixel defining sub-layer stacked in a direction away from the first base. The spacers dispose on a surface of the pixel defining layer facing away from the first base. The second pixel defining sub-layer includes a first conductive material doped at least in a surface of the second pixel defining sub-layer facing away from the first base, the spacers include a second conductive material doped at least in surfaces of the spacers facing away from the first base.

Substrate and method of manufacturing the same, method of manufacturing motherboard, mask and evaporation device

A crystal oscillation probe structure and an evaporation device are provided. The crystal oscillation probe structure includes a guide cover, a crystal oscillation probe and a mesh screen structure, the guide cover includes a chamber with a guide opening, the crystal oscillation probe is fixed in the chamber, the crystal oscillation probe includes at least one crystal oscillation sheet, the mesh screen structure includes a plurality of openings, and the mesh screen structure is located on a traveling path of a material traveling toward the at least one crystal oscillation sheet and disposed on a side of the at least one crystal oscillation sheet facing the guide opening.

Crystal oscillation probe structure and evaporation device

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Beijing, China

Peng Cao