Faraday Technology Corporation

Pei-Yuan Chou

Jinn-Shyan Wang

Yeong-Jar Chang

Chuen-Shiu Chen

A time detection circuit and a time detection method are provided. The time detection circuit includes an input signal processor and a time signal amplifier. The input signal processor receives a first input signal and a second input signal, calculates a time difference value between the first input signal and the second input signal, adjusts the time difference value by comparing the time difference value with a set reference value, and provides the adjusted time difference value. The time signal amplifier receives the adjusted time difference value, and amplifies the adjusted time difference value to generate an amplified time signal. The time signal amplifier operates in a linear operation region between a first time value and a second time value, and the set reference value is set according to the first time value and the second time value.

Time detection circuit and time detection method

An apparatus for jitter measurement includes a first delay circuit, a second delay circuit, and a control circuit. The first delay circuit imposes a preliminary phase delay on an input signal to generate a delayed input signal. The second delay circuit operates with the first delay circuit to impose a fine phase delay on the delayed input signal. The control circuit controls amounts of delays imposed by the first and second delay circuits, and fine tunes the phase delay of the delayed input signal according to the amounts of delays respectively imposed by delay elements of the first and second delay circuits, and estimates or calculates a jitter window for the input signal according to adjustment results of the first and second delay circuits.

Growing community of inventors

Hsinchu, Taiwan

Pei-Yuan Chou