Institute for Information Industry

Pei-Yi Lin

Chia-Wei Tien

Chin-Wei Tien

Chih-Wei Chen

Ting-Chun Huang

Tsung-Ta Tsai

A fuzz testing apparatus transmits a plurality of packets to the device under test (DUT), and calculates a probability of abnormal state, a normal response time and an abnormal-state-processing time of the DUT for the packets. Then, the fuzz testing apparatus estimates a maximum quantity of packets that can be sent to the DUT according to the probability of abnormal state the normal response time and the abnormal-state-processing time corresponding to the standby time of the DUT. Finally, the fuzz testing apparatus determines a plurality of test packets from a plurality of candidate test packets according to the maximum quantity of packets.

Fuzz testing apparatus and fuzz testing method

A system for producing test data produces fuzzing data at least according to first test data which is used for testing at least one first device and second test data which is used for testing a second device. Then, the system transmits the fuzzing data to the second device so as to test the second device.

System and method for producing test data

A device for producing test data stores a plurality of simulated test data each of which substantially conforms to the data format accepted by a device under test (DUT). The data format includes different data blocks. The device for producing test data also mutates each of the simulated test data in one of a plurality of mutation forms to generate a plurality of first test data for testing the DUT. Each of the mutation forms refers to mutating one of the data blocks in one of a plurality of mutation ways.

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Taipei, Taiwan

Pei-Yi Lin