Taiwan Semiconductor Manufacturing Comp. Ltd.

Pei-Wei Liao

Jerry Chang Jui Kao

Chih-wei Chang

Meng-kai Hsu

Shang-chih Hsieh

Shi-han Zhang

You-cheng Lai

A method including: providing a design data of an integrated circuit (IC), the design data comprising a first cell; identifying a first conductive line in the first cell as a critical internal net of the first cell, wherein the first conductive line is electrically connected between an input terminal of the first cell and an output terminal of the first cell; providing a library of the first cell, wherein the library includes a table of timing or power parameters of the first cell based on a multidimensional input set associated with the critical internal net; updating the design data by determining a timing or power value of the first cell based on the table; performing a timing analysis on the updated design data; and forming a photomask based on the updated design data.

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Hsinchu, Taiwan

Pei-Wei Liao