Unigen Corporation

Pei-Lung Yeh

David S Lin

Yu-Chieh Tseng

Che-Chen Chuang

Yi-Chieh Lin

In a system and method for cloud testing and remote monitoring of IC devices on a computerized test platform, the computerized test platform sends to a cloud server unit, which stores test programs corresponding respectively to different test items, a test request, which includes respective device codes of the IC devices and one (s) of the test items, via a communication network. The cloud server unit sends to the computerized test platform a test response, which includes one (s) of the test programs corresponding to the one (s) of the test items. The computerized test platform products test data corresponding to the device codes of the IC devices in response to execution of the one (s) of the test programs.

Growing community of inventors

Taipei, Taiwan

Pei-Lung Yeh