Taiwan Semiconductor Manufacturing Comp. Ltd.

Global Unichip Corporation

Industrial Technology Research Institute

Pei-Ju Lin

Ting-Hao Wang

Hao-Che Hsu

Yi-Chen Chen

Su-Yo Lin

Hsiang-Chun Hsu

Chih-Ching Liao

Guilhem Tourniaire

Kathryn Swindells

Bin-Ru She

Jun-Wan Wu

A method of measuring chip characteristics includes: outputting an operating voltage to a chip by a test device, wherein the chip comprises a plurality of oscillator circuits configured to generate a plurality of oscillating signals according to the operating voltage; and testing the chip by the test device under a situation that the test device outputs a system clock signal having a first clock period to the chip, including: changing the operating voltage sequentially with the test device until the chip changes from a normal state to a failure state, so as to generate a boundary operating voltage; and recording the plurality of oscillating signals generated according to the boundary operating voltage as measurement data by the test device, wherein the measurement data represents chip characteristics of the chip corresponding to the first clock period.

Method of measuring chip characteristics, test device and non-transitory computer readable media

A temperature sensing device and a temperature sensing method are provided. The temperature sensing device includes a sensor and a conversion circuit. The sensor generates a first sensing signal and a second sensing signal corresponding to a temperature based on different conditions. The conversion circuit performs a subtraction operation on the first sensing signal and the second sensing signal to obtain a result difference value, calculates a compensation value according to the result difference value and the first sensing signal, multiplies the result difference value and the compensation value to obtain a multiplication value, subtracts the multiplication value from the first sensing signal to generate a first value, adds the multiplication value to the first sensing signal to generate a second value, and divides the first value by the second value to generate an output value. The second value is a constant.

Temperature sensing device and temperature sensing method

A comparator circuitry includes an input pair circuit, a load circuit, and a compensation circuit. The input pair circuit is configured to compare a first input signal with a second input signal, in order to control a first bias current. The load circuit is coupled to the input pair circuit, and is configured to output an output signal having a first level from a first output terminal of the load circuit in response to the first bias current. The compensation circuit is coupled to the input pair circuit and the load circuit, and is configured to drain a compensation current from the first output terminal to a voltage source during a period that the load circuit generates the output signal having a first level, in which the voltage source is configured to provide a voltage having a second level.

Comparator circuitry

A performance calculation method suitable for a chip is provided. The chip includes oscillator circuit systems configured to generate oscillation signals and to sense operation states of the chip to adjust periods of the oscillation signals. The method includes following operations: when the chip is in a first operation state, constructing a first function according to the periods of the oscillation signals and a first performance value of the chip; when the chip is in a second operation state, constructing a second function according to the periods of the oscillation signals and a second performance value of the chip; adjusting coefficients of the first or second function according to trajectories of graphs of the first and second functions, so that the graphs of the first and second functions intersect at a coordinate point; constructing a performance function of the chip according to the first and second functions.

Performance calculation system, performance calculation method, and electronic device

A chip includes at least one oscillator circuitry and a controller circuitry. The at least one oscillator circuitry is disposed at different locations of the chip, and respectively generates a plurality of oscillating signals. The controller circuitry transmits the oscillating signals to an external system, in order to determine a performance of the chip based on the oscillating signals. Each of the at least one oscillator circuitry includes a first oscillator circuit and a second oscillator circuit. The first oscillator circuit senses a variation of a semiconductor device in the chip, in order to generate a first oscillating signal of the oscillating signals. The second oscillator circuit senses a variation of a parasitic component in the chip, in order to generate a second oscillating signal of the oscillating signals.

Chip and performance monitoring method

A comparator circuitry includes an input pair circuit, a load circuit, and a compensation circuit. The input pair circuit is configured to compare a first input signal with a second input signal, in order to control a first bias current. The load circuit is coupled to the input pair circuit, and is configured to output an output signal having a first level from a first output terminal of the load circuit in response to the first bias current. The compensation circuit is coupled to the input pair circuit and the load circuit, and is configured to drain a compensation current from the first output terminal to a voltage source during the load circuit generates the output signal having a first level, in which the voltage source is configured to provide a voltage having a second level.

The disclosure provides a cell culture system and a serum-free method for cultivating cells. The cell culture system includes a substratum, wherein the substratum has a surface. A polymer is disposed on the surface of the substratum, wherein the polymer is prepared by polymerizing a first monomer with a second monomer. The first monomer has a structure as represented by Formula (I), and the second monomer has a structure as represented by Formula (II): 

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Hsinchu, Taiwan

Pei-Ju Lin