Intel Corporation

Pedro Chaparro Monferrer

Xavier Vera

Javier Carretero Casado

Jaume Abella

Antonio Gonzalez

José González

Vivek K De

Ming Lei Zhang

Muhammad M Khellah

Christopher B Wilkerson

Grigorios Magklis

Antonio González

Jose Gonzalez

Qiong Cai

Gregory Martin Chrysler

Methods and apparatus relating to disabling one or more cache portions during low voltage operations are described. In some embodiments, one or more extra bits may be used for a portion of a cache that indicate whether the portion of the cache is capable at operating at or below Vccmin levels. Other embodiments are also described and claimed.

Disabling cache portions during low voltage operations

An apparatus for storing X-bit digitized data, the register file comprising: a plurality of registers each register configured for storing X bits, wherein each register is partitioned into Y sub-registers such that each sub-register stores at least X/Y bits, and wherein at least one extra X/Y-bit sub-register is incorporated in each register to provide redundancy in the number of sub-registers for a total of at least Y+1 sub-registers per register, so that if a first sub-register in a first register includes faulty bits, data destined for storage in the first sub-register is stored in a second sub-register, in the first register, that does not include faulty bits.

Capacity register file

A device having multiple cores executes an algorithm to control Thin-Film Thermoelectric Coolers (TFTEC) that employ the Peltier effect to remove heat from the various cores of the multi-core processor. The algorithms may combine Thread Migration (TM) and Dynamic Voltage/Frequency Scaling (DVFS) to provide Dynamic Thermal Management (DTM) and TFTEC control.

Microarchitecture controller for thin-film thermoelectric cooling

Low supply voltage memory apparatuses are presented. In one embodiment, a memory apparatus comprises a memory and a memory controller. The memory controller includes a read controller. The read controller prevents a read operation to a memory location from being completed, for at least N clock cycles after a write operation to the memory location, where N is the number of clock cycles for the memory location to stabilize after the write operation.

Memory apparatuses with low supply voltages

An integrated circuit is cooled by microarchitecture controlled Peltier effect cooling. In one embodiment, a temperature sensor thermally coupled to at least a portion of the integrated circuit of a die is adapted to provide an output as a function of the temperature of an integrated circuit portion. Operation of a thermoelectric cooler thermally coupled to the integrated circuit portion is controlled as a function of the sensor output, wherein a controller of the integrated circuit controls the thermal electric cooler. Other embodiments are described and claimed.

Microarchitecture control for thermoelectric cooling

A method and system to selectively move one or more of a plurality threads which are executing in parallel by a plurality of processing cores. In one embodiment, a thread may be moved from executing in one of the plurality of processing cores to executing in another of the plurality of processing cores, the moving based on a performance characteristic associated with the plurality of threads. In another embodiment of the invention, a power state of the plurality of processing cores may be changed to improve a power efficiency associated with the executing of the multiple threads.

Thread migration to improve power efficiency in a parallel processing environment

Methods and apparatuses for on-line testing for decode logic are presented. In one embodiment, a processor comprises translation logic to decode an instruction to micro-operations and extraction logic to determine first information about numbers of occurrences of fields in the micro-operations. In one embodiment, the processor further comprises verification logic to indicate whether the decoding results of the instruction are accurate based at least on the first information.

On-line testing for decode logic

Methods and apparatus to provide leakage power estimation are described. In one embodiment, one or more sensed temperature values () and one or more voltage values () are utilized to determine the leakage power of an integrated circuit (IC) component. Other embodiments are also described.

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Barcelona, Spain

Pedro Chaparro Monferrer