Technion Research & Development Foundation Ltd

Pavel Sidorenko

Oren Cohen

Yonina Eldar

Mordechai Segev

Yoav Shechtman

Oren Lahav

Or Peleg

Gil Ilan Haham

Alexander Szameit

Snir Gazit

Bing Kuan Chen

A ptychography system is presented for imaging an object located in an object plane. The ptychography system comprises an optical system, and a detection device. The optical system comprises a single shot ptychography arrangement configured and operable to create light response patterns from the object in the object plane on a pixel matrix of the detection device during the same exposure session of the detection device, wherein the optical system further comprises at least one light coding device configured and operable to apply at least one predetermined coding function to at least one of illuminating light and the light response of the object being collected, and said detection device is configured and operable with a predetermined duration of the exposure session during which the pixel matrix detects the collected light, such that image data indicative of the detected light during a single exposure session is in the form of a coded light response of the object being illuminated.

Ptychography based system and method

A single-exposure ptychography system is presented. The system comprises an optical unit defining an light input plane, an imaging plane, and an object plane between the light input and output planes. The optical unit comprises at least a first focusing assembly, whose front focal plane defines a location of the light input plane; and a diffraction arrangement at a predetermined position with respect to the light input plane. The diffraction arrangement is configured to create from input plane wave light structured light in the form of an array of illuminating beams forming a predetermined illumination pattern in the object plane; thereby providing that each of the illuminating beams creates a different intensity pattern in a known region at the light output plane.

Ptychography system

A method and system are presented for reconstructing an input field where the latter is sensed by a measurement system. The method comprises: providing measured data corresponding to output field of said measurement system; providing data about sparsity of the input field, and data about effective response function of the measurement system; and processing the measured data based on said known data, the processing comprising: determining a sparse vector as a function of said measured data, said data about the sparsity of the input field, and said data about the effective response function; and using the sparse vector for reconstructing the input information. The invention allows for sub-wavelength resolution in imaging applications, and allows for detection of very short pulses by slow detectors in some other applications.

Method and system for super-resolution signal reconstruction

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Haifa, Israel

Pavel Sidorenko