Physical Optics Corporation

Paul Wilkinson

David H Miller

Christopher Thad Ulmer

Paul I Shnitser

Edward Matthew Patton

Profilometers for industrial metrology and other applications are described. A line is projected on a surface to be profiled. The line is scanned to build a three dimensional point cloud allowing the three-dimensional (3D) profile of the surface to be determined. In some embodiments, the line is projected by a laser system. In other embodiments, the line is projected by a digital micromirror device (DMD). In still further embodiments, multiple lines, or other patterns are projected.

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San Pedro, CA, United States of America

Paul Wilkinson