Tanisys Technology, Inc.

Carroll Touch Inc.

Paul R Hunter

Archer R Lawrence

Jack C Little

James E Garrett

Michael S West

Arthur B Carroll

John K Carstedt

Stewart E Hough

Sam R Shaw

Joseph C Klein

A distributed tester method and system communicates test recipes for testing electronic devices from a host computer over a network to a test site. The test site translates test recipes into test instructions for execution by a test engine that determines the status of the electronic device. For instance, in a tester for testing memory, a test recipe is defined and stored with a host computer to determine test data for storage on the memory device under test at the test site. The host computer controls execution of the test recipe over the network. The test recipe is defined and stored in an XML formatted data file transmitted over the network to a processor at the test site. The test site processor translates the XML formatted data into test instructions for execution by a test engine. The test engine determines whether the memory device under test accurately stores data and provides the results, such as erroneously stored data, to the host computer through the network. A test design host and a global data master also interface with the network to aid the design and storage of test recipes. The distributed test method and system advantageously improves flexibility of testing over a geographically disbursed area and with divergent test recipes and devices under test.

Method and system for distributed testing of electronic devices

A system and method for testing a RIMM loaded with RDRAM integrated circuits generates and reads test transaction data with a test transaction engine, such as a microprocessor-based memory tester. A RIMM adapter interfaces with the test transaction engine and the RIMM under test to communicate test data, including test write, address, control and read data. A comparison of test read data returned to the test transaction engine from the RIMM against predetermined values allows a determination of the operational status of the RIMM. The RIMM adapter is embodied as an ASIC with plural FIFO circuits interfaced between the test transaction engine and a channel controller and RAC. The FIFOs reconcile differences in timing between generation and return of test data and demands by the RAC and channel controller. Separate read and write data paths between the test transaction engine and ASIC support improved rates of data transfer. The test transaction engine provides full speed test transactions by using instruction data to generate test data with FPGAs.

Method and system for testing RAMBUS memory modules

Method and system for testing rambus memory modules

A digital programmable delay which provides a series of pulses that are programmed in both pulse latency and trigger latency to control the operation of a memory module test system.

Programmable pulse generator

A tester for use with a device under test includes a processor, a signal timing editor to create representations of signal waveforms and associated times, and a test program executable on the processor that schedules events based on information from the signal timing editor. The test program schedules different delays for the events to compensate for variations in time delays between different signals coupled to the device under test.

Tester systems

A touch entry system employing arrays of emitter and detector opto devices located around the periphery of an irradiated field detects intrusion of an opaque element such as a stylus within the field. The detector analog output is converted to a digital signal for input into a microprocessor. Digital signals input into the microprocessor can vary due to inconsistencies in conventional opto devices. A programmable amplifier responsive to the microprocessors preconditions the analog signals prior to analog to digital conversion to bring all digital signals corresponding to the unblocked emitter beam condition within a normalized range before input into the microprocessor.

Growing community of inventors

Austin, TX, United States of America

Paul R Hunter