Other

Lucent Technologies Inc.

At+t Corp.

Paul Michael Bridenbaugh

Gustav Edward Derkits, Jr

Robert Cort Haddon

Gordon Albert Thomas

Robert McLemore Fleming

Franklin Richard Nash

Robert A Laudise

Theo Siegrist

Tasoltan T Basiev

The specification describes a test procedure for evaluating the susceptibility of electronic and photonic device packages to degradation effects caused by ambient hydrogen in the device package during the service life of the packaged device. The test procedure uses a hydrogen soak in which the subassembly parts are immersed in high concentrations of hydrogen gas at moderately elevated temperatures. The hydrogen gas is preferably diluted with an inert gas such as nitrogen or argon for safety in handling and processing. The test procedure can be used to screen components once their susceptibility to hydrogen attack has been established.

Method for testing and screening electronic and photonic packages for

A previously unknown phase of .alpha.-hexathienyl, designated .alpha.-6T/HT, exhibits diffraction peaks at 2.theta.=4.31.degree., 8.64.degree., 12.96.degree., 17.32.degree., 26.15.degree. and 29.08.degree. in a CuK.sub..alpha. powder X-ray diffraction pattern, and is expected to have properties (e.g., high hole mobility) that make the phase desirable for use in, e.g., thin film transistors. Substitution of thin films of .alpha.-6T/HT for prior art organic thin films in thin film transistors and other devices is contemplated.

Article comprising .alpha.-hexathienyl

Rare-earth doped single-crystal amplifiers serve to simultaneously amplify member channels of an optical fiber WDM system. A tailored amplification bandwidth sufficient for this purpose is the result of a variety of 'defects' which after the local crystal field as 'seen' by dopant ions.

WDM optical fiber system using crystal optical amplifier

Growing community of inventors

Somerville, NJ, United States of America

Paul Michael Bridenbaugh