International Business Machines Corporation

Paul M Alt

Chandrasekhar Narayan

Steven Lorenz Wright

Bruce Kenneth Furman

Raymond R Horton

Kevin Wilson Warren

Pedro A Chalco

Webster E Howard

Omesh Sahni

Benal Lee Owens, Jr

A matrix addressed display system designed so as to enable data line repair by electronic mechanisms which is efficient and low in cost and thus increases yield. Such active data line repair utilizes additional data driver outputs, a defect map memory in the TFT/LCD module and modification of the data stream to the data drivers by additional circuits between the display and the display adapter. A bus configuration on the display substrate is utilized which combines repair flexibility, low parasitic capacitance, and the ability to easily make the necessary interconnections. The number of interconnections is kept to a minimum, the connections are reliable, and the connections may be made with conventional wire bond or laser bond technology, or disk bond technology.

TFT LCD active data line repair

The elimination of crosstalk between data lines and pixel cells in a thin film transistor/liquid crystal display is accomplished by applying a data signal to a given data line for a time period less than the standard scan line period of the display, and applying a crosstalk compensation signal to the given data line for the remainder of the scan line period.

Method for eliminating crosstalk in a thin film transistor/liquid

An array of thin film transistor (TFT) devices is provided with a conductive region, such as a strip, for temporarily coupling a floating pel eletrode of each of the plurality of TFT devices to a conductor on an underlying substrate. The conductor may be a row or column metalization line associated with an adjacent row or column of the array. The conductive strip may therefore be utilized, in conjunction with appropriate voltage potentials and test circuitry, to test each of the TFT devices prior to the final fabrication of the TFT array into a completed flat panel display. Thus, nonfunctioning or out of specification arrays may be identified at an early point in the manufacturing cycle of the display. The strip may be comprised of amorphous silicon which is illuminated during the test in order to reduce the intrinsic resistance of the strip. The strip may also be comprised of a layer of metalization, which layer is removed from the array at the completion of the test.

TFT array for liquid crystal displays allowing in-process testing

It has been discovered for the practice of this disclosure that there is a threshold for switching with light an AC coupled electroluminescence (EL) device within the .DELTA.V of the luminance-voltage hysteresis loop thereof. Practice of this disclosure provides hybrid matrix-addressing of an electroluminescence display device with memory through luminance-voltage hysteresis by 'ANDING' electrical and optical signals. It has particular utility for a large aspect ratio display, e.g., a single line display, i.e., one for which there is more information content in one direction than in another direction.

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Yorktown Heights, NY, United States of America

Paul M Alt