Lucent Technologies Inc.

Agere Systems Inc.

Paul Kurt Wheeler

Richard Joseph McPartland

William G Burroughs

Ross Alan Kohler

Andrew Lawrence Webb

Robert H Arnold

Richard D Bell

A serial interface unit having an input shift register adapted to receive a serial input data from a serial data stream, and a destination request module. The input shift register converting the serial input data into a parallel input data. The input shift register in communication with at least two processors and the destination request module. The destination request module in communication with one of the at least two processors in response to an input shift register status signal and a processor designation signal, the selected processor adapted to receive the parallel input data.

Serial interface unit

A systematic method for assigning tester channels on an Automated Test Equipment (ATE) to various signal pins on Device Under Test (DUT). The method involves creating a test fixture or a load board for a digital Integrated Circuit (IC) by wiring the DUT pins to as few channel groups as possible. The number of channel groups required for each vector set load are calculated before the signal pins are assigned. Then, the signal pins are assigned in a systematic manner to the fewest number of channel groups. As the number of test channel groups is reduced, the amount of vector data loaded into the tester's vector memory before each test vector is executed also is reduced, therefore reducing the time and cost required to test the signal pins on the DUT.

Method for optimizing test fixtures to minimize vector load time for automated test equipment

An on-chip processor is used as a controller for burn-in and endurance testing of embedded non-volatile memory. An automated test machine downloads a test program into the non-volatile memory. The downloaded program contains a test program to be run on the non-volatile memory. When the burn-in or endurance test equipment activates the processor, the processor executes the program and performs a test on the non-volatile memory. The same method can be utilized to perform either the burn-in or endurance tests. Only the clock and reset lines are required to operate the test. Since the clock and reset lines are part of the processor's standard inputs, the method performs burn-in and endurance testing of an embedded non-volatile memory without bringing out the memory's address, data and control lines to the package pins of the integrated circuit. Since the clock and reset lines are part of the standard burn-in and endurance test equipment, the method also performs the testing without the use of expensive burn-in or endurance test equipment.

Automated method of burn-in and endurance testing for embedded EEPROM

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Allentown, PA, United States of America

Paul Kurt Wheeler