Olympus Ndt

R/d Tech Instruments Inc.

Paul Joseph DeAngelo

Steven Abe LaBreck

Andrew Thomas

Michael Drummy

Ehab Ghabour

Steven Besser

Marc Dulac

Daniel Stephen Kass

Agostino Abbate

Xiangdeng Xu

Erich Henjes

Coleman McCourt Flanagan

A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.

Apparatus and method for conducting and real-time application of EC probe calibration

A non-destructive inspection and testing instrument includes a housing and a first panel with a first type input to be assembled onto the housing and a second panel with a different, second type input to be assembled onto the housing. A first GUI module for the first panel implements a function upon an actuation of the first type input. A second GUI module for the second panel implements the same function upon an actuation of the second type input. A controller is configured to select the first GUI module when the first panel is associated with the instrument and to select the second GUI module when the second panel is associated with the instrument.

Reciprocal interface panels suitable for multi-purpose actuators

A peak visualization enhancement system for use with a non-destructive inspection (NDI) instrument using a digital display which replicates the haloing effect of analog cathode ray tube (CRT) displays. A peak detection algorithm is provided which intelligently selects the peak values from within the uncompressed digitized waveform while taking measures to prevent noise spikes and the like from being identified as valid waveform peaks. The digital display then highlights the identified peaks, or a subset of the identified peaks, on the compressed waveform display. In this way the effect of bright spots (halos) about the zero slope points on a waveform displayed on an analog CRT is replicated in a digitally compressed waveform display.

Peak visualization enhancement display system for use with a compressed waveform display on a non-destructive inspection instrument

Alerting a user of a material inspection device to a change in thickness of a material being inspected is disclosed. A thickness offset is determined from calibration information. The calibration information identifies a time of flight of a pulse through a reference sample similar in composition to a material to be inspected. The thickness offset indicates when a thickness of a material being inspected differs from a thickness of the reference sample. A calibration thickness alarm is set, the calibration thickness alarm corresponding to the thickness offset. A change in thickness of the material being inspected is detected. The calibration thickness alarm is engaged to alert the user of the inspection device of a detected change in thickness of the material being inspected.

Material inspection methods and devices

A system and method for carrying out non-destructive testing and inspection of test objects to assess their structural integrity uses a calibration module configured to provide V-Path time of flight (TOF) correction data over a plurality of object thickness points, obtained from an object or objects having known thicknesses using the same physical probe as is used for the inspection measurements. When a probe launches acoustical waves into a test object and an instrument and a control system compute a time of flight value of the acoustical waves launched by the probe, the pre-obtained V-Path TOF correction data is used to correct the measured time of flight computed by the instrument.

System and method for derivation and real-time application of acoustic V-path correction data

An ultrasonic transducer for measuring a part with a coating having at least one acoustic transducer, and a buffer delay line having an impedance matched to an impedance of the coating.

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Bridgewater, MA, United States of America

Paul Joseph DeAngelo