Lsi Logic Corporation

Lsi Corporation

Agere Systems Inc.

Atmel Corporation

Paul Jeffrey Smith

Jeffrey K Whitt

Frank Gasparik

Eugene Saghi

Joshua P Sinykin

Richard L Solomon

Brad D Besmer

Coralyn S Gauvin

Andrew Hadley

Travis Alister Bradfield

Guy Kendall

Douglas J Saxon

Brian G Reise

Steven Olson

Joy F Godbee

Methods and structure are provided for routing internal operational signals of a circuit for output via an external interface. The structure includes an integrated circuit. The integrated circuit comprises a block of circuitry components operable to generate internal operational signals for performing designated functions during normal operation of the circuit, a control unit, a test signal routing hierarchy, and an external interface. The test signal routing hierarchy is coupled to receive the internal operational signals and controllably selects the internal operational signals for acquisition and applies them to the control unit. The external interface provides communications between the integrated circuit and an external device during normal operation of the integrated circuit. The control unit receives the selected internal operational signals from the test signal routing hierarchy, and applies the selected internal operational signals to the external interface during normal operation of the integrated circuit.

Methods and structure for utilizing external interfaces used during normal operation of a circuit to output test signals

Methods and structure for correlating internal operational signals routed via different paths of a test signal selection hierarchy. The structure includes a functional block of circuitry operable to generate internal operational signals and clock signals. The integrated circuit also comprises a test signal selection hierarchy operable to receive the internal operational signals and the clock signals and to selectively route the internal operational signals and the clock signals. Further, structure includes a control unit operable to receive the clock signals from the test signal selection hierarchy, to determine a delay between received clock signals routed via different signaling pathways of the test signal selection hierarchy. The control unit is further operable to program a delay line based upon the delay between the clock signals and based upon internal operational signals correlated with the clock signals.

Methods and structure for correlation of test signals routed using different signaling pathways

A method of eliminating a runaway condition in a PLL includes the steps of: determining whether the PLL is locked to an input reference signal; when the PLL is not locked to the input reference signal, determining whether a frequency of an output signal generated by the PLL exceeds a prescribed maximum frequency; and when the frequency of the output signal generated by the PLL exceeds the prescribed maximum frequency, resetting the PLL to thereby eliminate the runaway condition.

Configurable reset circuit for a phase-locked loop

Circuits and associated methods for testing internal operation of an application integrated circuit. Features and aspects hereof add configurable test interrupt circuits to an application circuit design to permit dynamic, configurable interrupt generation from an integrated circuit based on conditions determined from monitoring of internal signals of the application circuit. The internal signals that may be tested and used to generate test interrupts are those not exposed to the external processor interface of the integrated circuit and thus may be configured to interrupt based on any internal state of the application specific functional circuits of the integrated circuit.

Circuits and associated methods for improved debug and test of an application integrated circuit

A data stream is transferred through a parallel data bus while the read or write strobe is adjusted. The resultant data is compared to the original data to detect errors with each data line of the parallel bus. The results are displayed on a grid whereby the characteristics of each line of the data bus may be visually understood. The characteristic image of the performance of the data bus may be used for debugging the bus, as well as for other uses wherein the performance is very highly characterized.

Characteristic image of electrical data bus

A method and apparatus for managing transmission of data signals in a plurality of data lines. Data signals are received on the data lines and a reference signal. On each of the data lines, a delay between the data signal and the reference signal is measured to form a plurality of delay measurements. A set of delay values from the delay measurements is generated. In a preferred embodiment of the present invention, the delay values are selected to equalize the delay in each of the data lines to have the same delay as the data line having the longest delay. The delay values are used to adjust delay in a transmission in each of the plurality of data signals in the data lines. In the preferred embodiment of the present invention, the reference signal is set such that transitions for the data signals are centered to the middle of a pulse for the reference signal.

Method and apparatus for multi-channel data delay equalization

A method and apparatus for a propagation delay and time calibration. The apparatus includes a ring oscillator having a first set of elements. The apparatus also includes delay units. The ring oscillator is used to generate a clock signal used to measure the delay in signals received at the delay blocks. In the depicted examples, the clock signal generated by the ring oscillator is used to run a counter that counts the delay between a transition in a data signal and a reference signal. Each of the delay units includes a second set of elements matching those of the first set of elements in the ring oscillator. The elements in the set of elements are selected such that they track the period of the ring oscillator signal generated by the ring oscillator. The delay units are used to implement the desired delay.

System for measuring delay of digital signal using clock generator and delay unit wherein a set of digital elements of clock generator identical to a set of digital elements of delay unit

An integrated circuit device with reduced noise is described. In traditional simultaneous output switching integrated circuits the noise is proportional to the number of concurrently switching outputs. This excessive supply noise can cause the integrated circuit to malfunction through the loss of data. In the present invention, switching supply noise is reduced in the device without increasing the number of input-output pins by synchronously skewing the output driver. In a preferred embodiment, flip-flops are used to control the phase of the switching outputs in order to reduce the noise and instantaneous power by the number of phase assignments.

IO power management: synchronously regulated output skew

Spare cells placement methodology

A programmable input/output (I/O) pad internal resistive pull circuit assembly capable of providing programmable chip (SCSI Controller) initialization is disclosed. In an exemplary embodiment, the assembly includes a non-volatile memory cell disposed in said non-volatile memory device. First and second transistor devices are coupled to the non-volatile memory cell. The non-volatile memory cell is capable of being programmed for providing at least one of a pull-up and a pull-down on an associated signal line of the non-volatile memory device thereby furnishing a predetermined reset value to a controller device of the control system.

System for programmable chip initialization

In a multifunction PCI device containing identical backend functions or other large, redundant functional blocks, a single backend function is selected as a primary function while in test mode. All backend I/O channels are then simultaneously tested in parallel, with the same data and control signals from a PCI local bus being driven to all backend channels during the same test clock cycle. A single backend channel is designated as the primary for providing requisite handshaking signals during output to the backend I/O channels. Input data from each backend channel is received in parallel and compared, with miscompares being flagged to allow testing of the input data path from the respective backend I/O channel. Only signals from the primary backend I/O channel are designated for transmission to the PCI local bus. Signals from the remaining backend channels are received in parallel with and compared to the signals from the primary channel, and miscompare flags are generated for any discrepancies identified. The resulting parallel testing of all backend I/O channels within the multifunction device reduces the number of test vectors needed to achieve fault grade goals.

Test mode for multifunction PCI device

A memory system in which the input/output circuitry can be tested independently from the storage cells and decoder therein by permitting a write operation, with information at the memory inputs being provided to the memory outputs as well as to the storage cells.

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Colorado Springs, CO, United States of America

Paul Jeffrey Smith