Other

Paul J Reuter

Wu-Tung Cheng

Christopher John Hill

Omar Kebichi

Yahya M Z Mustafa

Nilanjan Mukherjee

Yu Jane Huang

Srinivas Patil

Sudhakar Mannapuram Reddy

Chien-Chung Tsai

Omer Ghazi Samman

Ian Alexander Burgess

A circuit is disclosed for testing memories using multiple built-in self test (BIST) controllers embedded in an integrated circuit (IC). The BIST controllers are brought to a synchronization point during the memory test by allowing for a synchronization state. An output signal from an output pin on the IC indicates the existence of a synchronization state to automated test equipment (ATE). After an ATE receives the output signal, it issues a resume signal through an IC input pin that causes the controllers to advance out of the synchronization state. The ATE controls the synchronization state length by delaying the resume signal. Synchronization states can be used in parametric test algorithms, such as for retention and IDDQ tests. Synchronization states can be incorporated into user-defined algorithms by software design tools that generate an HDL description of a BIST controller operable to apply the algorithm with the synchronization state.

Synchronization point across different memory BIST controllers

Methods are described for scheduling the concurrent testing of multiple cores embedded in an integrated circuit. Test scheduling is performed by formulating the problem as a bin-packing problem and using a modified two-dimensional or three-dimensional bin-packing heuristic. The tests of multiple cores are represented as functions of at least the integrated circuit pins used to test the core and the core test time. The representations may include a third dimension of peak power required to test the core. The test schedule is represented as a bin having dimensions of at least integrated circuit pins and integrated circuit test time. The bin may include a third dimension of peak power. The scheduling of the multiple cores is accomplished by fitting the multiple core test representations into the bin.

Scheduling the concurrent testing of multiple cores embedded in an integrated circuit

A method performed by a software design tool for providing an algorithm to a BIST controller that tests memory within a circuit. The method includes reading a description of a user defined test algorithm for a BIST controller, translating the description into an in-memory representation of the user defined algorithm, and reading a memory model selected by a user. The in-memory representation of the user-defined algorithm is associated with the selected memory model. From the association an HDL description of a BIST controller is generated. The HDL description is operable to apply the user defined algorithm to a memory corresponding to the selected memory model.

Method for providing user definable algorithms in memory BIST

A computer-implemented method and apparatus for creating a testable circuit design that includes one or more embedded cores. The method includes identifying an embedded core within the circuit design; associating certain pins of the embedded core with pins of the circuit design; and inserting into the circuit design access circuitry coupling the certain connection pins of the embedded core to the associated pins of the circuit design. The method further includes providing test vectors for the embedded core; and generating test vectors for the circuit design by mapping the core test vectors applicable to the certain pins of the embedded core to the associated pins of the circuit design. The cores within the circuit design can then be tested after manufacture by applying the design test vectors to the circuit design.

Method and apparatus for creating testable circuit designs having embedded cores

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Northboro, MA, United States of America

Paul J Reuter