Alcatel-lucent USA Inc.

Alcatel Lucent

Paul Hampton Franklin

Eric Jonathan Bauer

Douglas A Kimber

Xuemei Zhang

Meenakshi Sharma

Shirish N Kher

Hongzhou Wang

Ying-Che Chien

Holly-Dee Rubin

David A Gatenby

Paul A Remick

Niren Cc Choudhury

Philip L Scarff

Method and apparatus for calculating warranty cost includes determining values for a plurality of parameters that characterize a corresponding plurality of physical conditions of a product that is returned under warranty, determining values for a plurality of variables that characterize a customer profile for the product and evaluating an expression that calculates warranty cost based on said determined parameter and variable values. The plurality of physical conditions of the product includes the conditions of no-trouble-found (NTF), repaired, junked, and subject to further failure mode analysis (FMA). The plurality of parameters further comprises probabilities and costs that correspond to each of the physical conditions. Evaluating the above expression includes evaluating a first expression that calculates repair, product conformance and Dead-On-Arrival cost and evaluating a second expression that calculates Change Notice cost. Subsequently, the two costs are summed to arrive at the total warranty cost.

Method and apparatus for warranty cost calculation

The invention includes a method for predicting a scheduled downtime associated with a system. In one embodiment, a method includes determining a system model associated with the system according to a system type of the system, determining at least one scheduled system downtime event type associated with the system using the system model, selecting at least one scheduled system downtime event model according to the at least one scheduled system downtime event type, and predicting the scheduled system downtime using the at least one scheduled system downtime event model.

Method and apparatus for predicting scheduled system downtime

The invention includes a method and apparatus for assessing an available version of a sourced element. The method includes obtaining a description of an available version of the sourced element, identifying a plurality of evaluation items for the sourced element by evaluating the description using at least one evaluation category including a plurality of evaluation parameters, and determining an overall assessment of the available version of the sourced element using the identified evaluation items for the sourced element. The overall assessment is indicative of a value associated with the available version of the sourced element. The method may further include generating overall assessments of other available versions of a sourced element or generating overall assessments of available versions of other sourced elements, and prioritizing the available versions of the sourced elements using the overall assessments of the available versions of the sourced elements.

Method and apparatus for assessing sourced elements

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Colts Neck, NJ, United States of America

Paul Hampton Franklin