Teradyne, Inc.

Nextest Systems Corporation

Paul G Trudeau

Michael A Caradonna

David Trevisan

Paul Magliocco

Ray Wakefield

A E LeColst

Isreal Blagdan

Gerald L Forbes

A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more pins than can be accommodated by a single tester. The tester includes a test site with a number of pin electronics channels, an interface for interfacing with the device, and a computer for interfacing with a host computer in the test system. The testers can be fastened directly to one another or to a common frame. Preferably, the interface enables a single device board to simultaneously engage interfaces on multiple testers. More preferably, the interface extends from a top surface of the tester to engage the device board. Vents in top and front surfaces of an enclosure enables movement of air to cool components of the tester without interference from testers on either side or a back of the enclosure.

System for testing DUT and tester for use therewith

This invention provides a manipulator for positioning a test head relative to a prober or other reference. The manipulator has a frame; a linkage coupled to the frame and including first and second links having freedom of rotation about respective pivots and a third link coupled to the first and second links such that the third link has translational and rotational degrees of freedom of movement; and an adaptor coupled to the third link and configured to attach to a test head. The invention also provides a method of controlling the manipulator.

Portable manipulator for stackable semiconductor test system

A semiconductor tester is disclosed that is adapted for testing semiconductor devices disposed on a handling apparatus. The semiconductor tester includes a tester housing defining a self-supporting frame and formed with an externally accessible opening adapted for receiving the handling apparatus. A test controller is disposed within the housing and carried by the frame. Pin electronics including tester circuitry are responsive to the test controller and proximately coupled thereto and mounted to the frame. A docking apparatus is disposed above the opening and is adapted to couple the tester circuitry to the handling apparatus.

Integrated test cell

A cooling unit is disclosed for cooling a plurality of spaced-apart circuit boards having elongated edges and disposed within an integrated test cell. The cooling unit includes a supply path for directing a cooled cooling medium between the plurality of circuit boards and in the direction of the elongated edges and a heat exchanger. The heat exchanger is disposed in a substantially vertical relationship above the circuit boards and has an input to receive a heated cooling medium from the circuit boards. The heat exchanger further includes a converter to convert the heated cooling medium to a cooled cooling medium, and an output for discharging the cooled cooling medium. A circulation unit is disposed proximate the heat exchanger output, and is operative to draw the heated cooling medium from between the circuit boards, through the heat exchanger and to recirculate the cooled cooling medium through a recirculation path. The recirculation path has a distal end coupled to the supply path to form a closed configuration.

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Mountain View, CA, United States of America

Paul G Trudeau