Topometrix Corporation

Other

Paul E West

Ronald C Gamble

Marc R Schuman

Huddee Ho

Russell J Pylkki

A method for rapidly deploying a floating hot tub is disclosed. The method includes providing a collapsible frame, having a collapsed configuration and a deployed configuration. The deployed frame defines an interior volume, at least one seat, and an upper periphery. An insulated liner sized is deployed and attached to the deployed collapsible frame. The insulted liner is filled with water. The water within the insulated liner is heated.

Methods of deploying a portable floating hot tub

A portable floating hot tub that is easy to assemble and take down and can be used in environments with extremely cold and turbulent water. The hot tub has three main components: a collapsible frame made of connected rigid members, an insulated liner sized and shaped to closely fit against the deployed frame and form a subassembly, and an inflatable pontoon that may have a central aperture for receiving the subassembly. The pontoon is first inflated and placed on the body of water, after which the frame and liner subassembly are placed over the central aperture. Filling the internal volume defined by the insulated liner with water causes the subassembly to descend within the pontoon. Cooperating means on the subassembly and/or pontoon prevent the subassembly from passing completely through the central aperture. A source of heated water such as a portable heater having a heating capacity of at least 30,000 BTUs rapidly heats up the water within the hot tub. The system components can be transported in one or more carry bags of less than 100 pounds and deployed and taken down by one person in an extremely small space, such as on a boat.

Portable floating hot tub

A system for controlling the operation of a scanning probe microscope that greatly simplifies the microscope's operation is disclosed. The software design incorporates several advanced features such as a sample designator file, video tutorials, automation algorithms, and the ability to remotely load sample designator files and video tutorials.

Scanning probe microscope control system

An environmental cell for use with a scanning probe microscope includes a cell chamber, a probe mounted to the cell chamber, a puck selectively connected to the cell chamber, a sample holder selectively inserted in the puck, and a translation mechanism coupled to the sample holder to move the sample holder. Gasses or liquids may be introduced to the environmental cell through channels formed in either the puck, sample holder, or cell chamber.

Environmental cell for a scanning probe microscope

The scanning probe microscope translation apparatus includes a scanning probe microscope for examining a specimen, with a specimen stage for mounting the specimen for examination by the scanning probe microscope, and a first translator mounted to the scanning probe microscope for translating the specimen stage relative to the scanning probe microscope. A support frame is dimensioned and adapted to be mounted in a specimen chamber of a scanning electron microscope, and a second translator is provided for scanning the scanning probe microscope relative to the support frame. The second translator is mounted on dual mass plates provided for isolating the scanning probe microscope from external vibrations, and suspension device are provided for suspending the mass plates from the support frame. A vacuum load lock system permits moving the scanning probe microscope, specimen stage, first translator, and mounting assembly into and out of the vacuum of the scanning electron microscope vacuum chamber.

Scanning probe microscope apparatus for use in a scanning electron

The synchronous sampling scanning force microscope includes a reflective cantilever arm having a free end which is oscillated at a frequency different from the resonance frequency of the cantilever arm. The motion of the oscillating cantilever arm is measured, to generate a deflection signal indicative of the amplitude of deflection or phase shift of the cantilever arm. Selected portions of cycles of the output signal are sampled, for generating output signal data indicative of deflection of the near and far excursions of the probe. The method and apparatus permit monitoring of compliance of the surface of the specimen by multiple sampling at a rate greater than the period of oscillation of the cantilever probe of the microscope.

Synchronous sampling scanning force microscope

The scanning probe microscope translation apparatus includes a scanning probe microscope for examining a specimen, with a specimen stage for mounting the specimen for examination by the scanning probe microscope, and a first translator mounted to the scanning probe microscope for translating the specimen stage relative to the scanning probe microscope. A support frame is dimensioned and adapted to be mounted in a specimen chamber of a scanning electron microscope, and a second translator is provided for scanning the scanning probe microscope relative to the support frame. The second translator is mounted on dual mass plates provided for isolating the scanning probe microscope from external vibrations, and suspension O-rings are provided for suspending the mass plates from the support frame. A vacuum load lock system permits moving the scanning probe microscope, specimen stage, first translator, and mounting assembly into and out of the vacuum of the scanning electron microscope vacuum chamber.

The scanning thermal probe microscope measures a thermal parameter such as thermal conductivity or temperature of surface contours of a specimen with a thermal sensor maintained in thermal communication with the surface of the specimen and maintained at a temperature different than that of the specimen. The thermal sensor is disposed on the free end of a cantilever arm in thermal communication with the probe. A thermal feedback bridge circuit can maintain the thermal sensor at a constant temperature by heating or cooling the sensor, and provides a signal for determining the heat transfer between the probe and the specimen. The cantilever arm includes first and second legs of electrically conductive material, and the thermal sensor comprises a narrowed portion of the conducting material having a relatively high temperature coefficient of resistance.

Thermal sensing scanning probe microscope and method for measurement of

The scanning force microscope is an improved free standing type scanning force microscope with integrated scanning drivers for examination of a wide range of sizes and weights of stationary specimens, with the capability of scanning a sample in contact with a fluid. The scanning force microscope also includes motorized driver legs for operating the approach of the optical lever arm and sensor head to the sample, to allow for automation of the approach of the sensor head to the specimen.

Scanning force microscope

The electromechanical translation apparatus includes a translation drive assembly having front and rear drive leg members coupled together with central extension piezoelectric members, and piezoelectric clamping members which clamp the drive leg members between opposing bearing members of a lower base. The translation drive assembly may directly carry an object for precise positioning of the object, or may carry an upper movable base which in turn may be translated along an axis perpendicular to the direction of movement along the lower base, so that an object placed upon the upper movable base can be precisely positioned.

Growing community of inventors

Cupertino, CA, United States of America

Paul E West