Kioxia Corporation

Toshiba Memory Corporation

Paul Abrahams

Ilya Shlimenzon

Timothy Simon Butler

Various implementations described herein relate to systems and methods for determining abnormal leakage current of a capacitor by determining a number of recent leakage current values for the capacitor and determining a maximum upper limit, minimum upper limit, maximum lower limit, and minimum lower limit based on leakage current values different from the recent leakage current values. A present upper limit and a present lower limit are determined for the recent leakage current values. Abnormal leakage current is determined in response to determining that the present upper limit being greater than an upper threshold (determined based on the maximum upper limit and the minimum upper limit) or the present lower limit being less than a lower threshold (determined based on the maximum lower limit and the minimum lower limit).

Systems and methods for PLP capacitor health check

A solid state drive (SSD) with improved techniques for testing power loss protection (PLP) capacitors and a method for testing PLP capacitors of SSDs is disclosed. In one embodiment, the SSD includes a memory controller and one or more non-volatile memory devices and a volatile memory device coupled to the memory controller. The SSD also includes a PLP capacitor configured to supply a first voltage to the memory controller, the one or more non-volatile memory devices, and the volatile memory device in the event of a power loss or failure of the SSD. In one embodiment, the PLP capacitor is further configured to increase the first voltage to a second voltage prior to testing the PLP capacitor. In another embodiment, the memory controller is configured to reduce a volume of data stored in the volatile memory device prior to testing the PLP capacitor.

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San Jose, CA, United States of America

Paul Abrahams