Other

Honeywell International Inc.

Paul A Sweeney

Gregory A Campbell

Randy Marvin Miller

Nestor J Perozo Piña

Bangshu Cao

Nestor J Perozo Pina

A method includes obtaining pressure measurements associated with fluid that passes through a flow restrictor, where the pressure measurements identify pressures upstream and downstream from the flow restrictor. The method also includes generating estimated flow measurements based on the pressure measurements. The method further includes comparing the estimated flow measurements and actual flow measurements generated by a flow meter that is fluidly coupled to the flow restrictor. In addition, the method includes determining whether a problem exists based on the comparison. The flow restrictor could provide a fixed restriction or a variable restriction for the fluid. An overall loss coefficient associated with the flow restrictor could be used to generate an estimated flow measurement.

Apparatus and method for creating inferential process flow measurements using flow restrictor and upstream and downstream pressure measurements

A method and apparatus for determining the location and stability of location of the edges of an object such as an extruded blown film polymeric material annulus. By real time detection of the edge location and mathematical and statistical manipulation of the data in both time and frequency domains, the stability and effects of extrusion parameters on the object can be determined.

Video method and apparatus for measuring and controlling dimensional

A device and method are provided for determining the bulk (average) temperature, surface temperature, temperature profile, and thickness of radiation translucent materials. These material functions are determined by evaluation of the intensity of the radiation emitted from the material using two detectors with a radiation source placed in the optical path of one of the detectors. The data is taken at several intensities of source radiation and reduced to obtain the bulk temperature and material thickness. The second detector is used to measure the surface temperature. These data are then used to determine the temperature profile in the material.

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Potsdam, NY, United States of America

Paul A Sweeney