Texas Instruments Corporation

Patrick T Bohan

Dale A Heaton

William Clay Boose

A system for testing a device includes a processor that operates to execute instructions, where the instructions are used to test a device. The processor also operates to generate test signals associated with the test instructions. An interface apparatus is coupled to the processor and operates to communicate the test signals to the device. The interface apparatus includes connectors, where each connector operates to communicate at least one of the test signals.

System and method for testing a device

The present invention is directed to a diagnostic compiler for use with a pipeline analog-to-digital converter (ADC) having code sequences corresponding to stages thereof. In one embodiment, the diagnostic compiler includes a transition locator configured to determine transition locations for the code sequences. The diagnostic compiler also includes a characteristics indicator coupled to the transition locator and configured to provide at least one characteristic of the ADC based on the transition locations.

Diagnostic compiler for pipeline analog-to-digital converter, method of compiling and test system employing the same

In a method and system for testing a device, a tester is operable to generate a first set of test signals for testing the device. The tester is electrically coupled to a test head, which in turn provides electrical coupling to the device. A test assembly is operable to generate a second set of test signals for testing the device. The test assembly is electrically coupled to an interface apparatus, which is adapted to be removably secured to the test head. The interface apparatus is operable to communicate the first and second set of test signals to the device.

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Richardson, TX, United States of America

Patrick T Bohan